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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD | 2023-12-22 13:00 |
Tochigi | Teikyo University | Collision-less Magnetic Pulse Welding Experiments of Sheet Metals Using Multi-Turn Flat Coil Tomokatsu Aizawa (Metropolitan College of Technology)  EMD2023-32 |
Experimental results of collision-less magnetic pulse welding for Al/Cu or Al/Al sheets have already been reported using... [more] | EMD2023-32 pp.1-6 |
| R, EMD | 2022-02-10 15:10 |
Online | Online | Magnetic Pulse Welding of Al/Cu Sheets Using 10-Turn Flat Coil Tomokatsu Aizawa (Tokyo Metropolitan College) R2021-44 EMD2021-12 |
This magnetic pulse welding can electrically connect Al sheet and Cu sheet at low temperature with high quality. Welding... [more] | R2021-44 EMD2021-12 pp.6-11 |
| EMCJ, EMD, WPT (Joint) [detail] |
2020-07-03 16:30 |
Online | Online | Measurement of transient electric field at the occurrence of electrostatic discharge when a charged object approaches a grounded object Hajime Tomita (JNIOSH) EMCJ2020-19 |
Electrostatic discharge (ESD) is one of electromagnetic wave noise sources which affect the function of mechatronics equ... [more] | EMCJ2020-19 pp.7-12 |
| EMD | 2019-10-18 13:05 |
Ibaraki | Magnetic pulse welding method commutating discharge current to collision part of Al/Cu sheets (2nd Peport) Tomokatsu Aizawa (Tokyo Metropolitan College) EMD2019-36 |
In this report, magnetic pulse welding is performed by rapidly flowing a damped-oscillating discharge current from a cap... [more] | EMD2019-36 pp.1-6 |
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| EMD | 2019-06-14 16:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Magnetic pulse welding method commutating discharge current to collision part of Al/Cu sheets Tomokatsu Aizawa (Tokyo Metropolitan College) EMD2019-7 |
In this report, magnetic pulse welding is performed by rapidly flowing a discharge current from a capacitor bank to an i... [more] | EMD2019-7 pp.1-6 |
| EMD | 2019-05-17 14:00 |
Miyagi | Cyberscience Center, Tohoku University | Proposal of High Speed Mechanical Switch for Commutation of Discharge Current in Magnetic Pulse Welding of Sheet Metals Tomokatsu Aizawa (Tokyo Metropolitan College) EMD2019-2 |
In this report, magnetic pulse welding is done by rapidly flowing a large discharge current from a capacitor bank to an ... [more] | EMD2019-2 pp.7-11 |
| EMCJ | 2018-07-27 13:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Measurement of discharge current using shielded-loop probe caused by ESD in spherical electrodes. Masato Oikawa, Kento Kato, Shinobu Ishigami, Ken Kawamata, Shigeki Minegishi (Tohoku Gakuin Univ.), Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2018-28 |
The relationship between the electromagnetic radiation intensity accompanying the spherical electrode ESD and the peak d... [more] | EMCJ2018-28 pp.37-42 |
| EMCJ, EMD | 2016-07-15 16:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Magnetic Pulse Seam Welding of Al/Cu Sheets using 6 -Turn Flat Coil Tomokatsu Aizawa (Tokyo Metropolitan College) EMCJ2016-49 EMD2016-22 |
The effective welding of Aluminum (Al)/Copper (Cu) is one of the technical problems to be related to Li-ion batteries in... [more] | EMCJ2016-49 EMD2016-22 pp.31-36 |
| EMCJ, PEM (Joint) |
2014-11-14 15:15 |
Tokyo | AIST Tokyo Waterfront | A Study of Electrostatic Discharge Immunity Testing for Wearable Equipment Takeshi Ishida (Noiseken/UEC), Fengchao Xiao, Yoshio Kami, Osamu Fujiwara, Shuichi Nitta (UEC) EMCJ2014-72 |
The electrostatic discharge (ESD) immunity test for electronic equipment is specified in the international standard IEC ... [more] | EMCJ2014-72 pp.31-35 |
| NLP, CAS | 2014-10-16 11:30 |
Ehime | Ehime University | An Experimental Study on Equivalent Circuit Model of Discharge Current Behavior in Multicell Lithium-ion Battery Kazuki Yasuhara, Yoshihiko Susuki, Takashi Hikihara (Kyoto Univ.) CAS2014-57 NLP2014-51 |
Nowadays, multicell lithium-ion batteries are used in electric vehicles, power storage devices, and so on. To use such b... [more] | CAS2014-57 NLP2014-51 pp.33-38 |
| SDM | 2011-12-16 11:20 |
Nara | NAIST | Evaluation of Intrinsic Defects in Sacrificial Oxidized High-Purity Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy Seiji Nishikawa, Ryota Okada, Hideharu Matsuura (Osaka Electro-Communication univ.) SDM2011-136 |
To determine the energy levels of intrinsic defects in high-purity semi-insulating 4H-SiC, we apply DCTS (Discharge Curr... [more] | SDM2011-136 pp.23-28 |
| SDM | 2010-12-17 14:10 |
Kyoto | Kyoto Univ. (Katsura) | Effects of Sacrifice Oxidation on Characterization of Defects in High-Purity Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy Seiji Nishikawa, Seigo Kitanoya, Hideharu Matsuura (Osaka Electro-Communication Univ.) SDM2010-194 |
To determine the energy levels of intrinsic defects in high-purity semi-insulating 4H-SiC, we apply discharge current tr... [more] | SDM2010-194 pp.51-56 |
| EMCJ | 2010-01-22 10:55 |
Okinawa | University of the Ryukyus | Effects on Discharge Current Wave and Their Frequency Spectra of Built-In Inductor for Contact Discharge of ESD-Gun Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2009-115 |
International Electrotechnical Commission (IEC) has prescribed an immunity test (IEC61000-4-2) of electronic equipment a... [more] | EMCJ2009-115 pp.99-103 |
| EMCJ, IEE-EMC | 2009-12-18 13:50 |
Gifu | NIFS | Frequency Spectra and Their Uncertainty of Discharge Current Waveform for Contact Discharge of ESD-Generators Yoshinori Taka, Fumihiko Toya, Osamu Fujiwara (Nagoya Inst. of Tech.) |
International Electrotechnical Commission (IEC) has prescribed an immunity test (IEC61000-4-2) of electronic equipment a... [more] | EMCJ2009-94 pp.55-58 |
| EMCJ | 2009-04-24 14:55 |
Okayama | Estimation of Discharge Currents Injected onto Ground for Contact Discharge from ESD-Gun Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2009-5 |
International Electrotechnical Commission (IEC) prescribes an immunity test (IEC61000-4-2) of electronic equipment for e... [more] | EMCJ2009-5 pp.25-29 |
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| EMCJ | 2009-04-24 15:20 |
Okayama | Uncertainty of Discharge Current Waveform for Contact Discharge of ESD-Gun onto Ground Takashi Adachi (Nagoya Inst. of Tech.), Norio Yamamoto (Industrial Research Center of Shiga Prefecture), Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2009-6 |
International Electro-technical Commission (IEC) prescribes the immunity test (IEC61000-4-2) of electronic equipment aga... [more] | EMCJ2009-6 pp.31-34 |
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| EMCJ | 2008-12-19 16:00 |
Gifu | Gifu Univ. | Influence of Built-In Inductor on Rising Part of Discharge Current Waveform for Contact Discharge of ESD-Gun. Fumihiko Toya, Yoshinori Taka, Osamu Fujiwara (NIT), Shinobu Ishigami, Yukio Yamanaka (NICT) EMCJ2008-99 |
The International Electrotechnical Commission (IEC) prescribes an immunity test (IEC61000-4-2) of electronic equipment f... [more] | EMCJ2008-99 pp.75-79 |
| VLD, ICD | 2008-03-06 16:35 |
Okinawa | TiRuRu | Comparison of Power consumption between dynamic voltage scheme and multi-supply voltage scheme for system LSI Satoshi Hanami, Shigeyoshi Watanabe (Shonan Inst. of Tech.) VLD2007-155 ICD2007-178 |
Reduction of power dissipation caused by dynamic current, gate leakage current, and subthreshold leakage current of mult... [more] | VLD2007-155 ICD2007-178 pp.67-72 |
| EMCJ | 2007-06-22 14:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Wideband Measurement of Discharge Current through Fingertip from Charged Human-body Yoshihisa Kagawa, Yoshinori Taka, Osamu Fujiwara (N.I.T) EMCJ2007-26 |
Immunity testing for human electrostatic discharge (ESD) is being prescribed in IEC 61000-4-2, in which an ESD-gun is us... [more] | EMCJ2007-26 pp.45-50 |
| ICD, SIP, IE, IPSJ-SLDM | 2006-10-27 10:50 |
Miyagi | Design method of low-power dual-supply-voltage system LSI taking into account leakage current of MOSFET Shigeyoshi Watanabe, Masaki Kanai, Akira Nagasawa, Satoshi Hanami, Manabu Kobayashi, Toshinori Takabatake (SIT) |
Reduction of power dissipation caused by dynamic current, gate leakage current, and subthreshold leakage current of dual... [more] | SIP2006-106 ICD2006-132 IE2006-84 pp.31-36 |
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