IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 26  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2022-03-01
10:55
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
On Correction for Temperature and Voltage Effects in On-Chip Delay Measurement
Takaaki Kato (KIT), Yousuke Miyake (PRIVATECH), Seiji Kajihara (KIT) DC2021-67
It is effective for aging of a logic circuit to measure a circuit delay periodically in field. In order to compare the d... [more] DC2021-67
pp.18-23
DC 2020-12-11
13:00
Hyogo
(Primary: On-site, Secondary: Online)
A Degradation Prediction of Circuit Delay Using A Gradient Descent Method
Seiichirou Mori, Masayuki Gondou, Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech) DC2020-59
As the risk of aging-induced faults of VLSIs is increasing, highly reliable systems require to predict when the aging-in... [more] DC2020-59
pp.1-6
HCS 2020-03-05
11:30
Online Online Meeting [Online] Robust Negative-Suggestion Effects and Weak Prototype Effects in Face Memory -- An Account by the Processing-Fluency Heuristic --
Takashi Kato (Kansai Univ), Shigeru Mukaida (Hokkaido Information Univ), Koji Tanaka (KIT) HCS2019-95
Using featural prototypes (novel faces synthesized with features taken from separate original faces) and configural prot... [more] HCS2019-95
pp.59-64
DC 2019-12-20
16:30
Wakayama   Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test
Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] DC2019-85
pp.37-42
HIP 2019-10-30
13:35
Kyoto Kyoto Terrsa Prototype and Negative-Suggestibility Effects in Face Memory -- A Processing Fluency Account --
Takashi Kato (Kansai Univ), Shigeru Mukaida (Hokkaido Information Univ) HIP2019-48
Using featural prototypes (i.e., novel faces with studied features taken from separate study faces), this study examined... [more] HIP2019-48
pp.7-12
HCS 2019-03-07
15:50
Hokkaido Hokusei Gakuen Univ. First impressions of the face affected by the configuration and size of the eyes and facial coloration -- Are healthy-looking faces attractive? --
Takashi Kato (Kansai Univ.), Shigeru Mukaida (Hokkaido Information Univ.) HCS2018-73
Using female faces this study investigated the effects of the configuration and size of the eyes and facial coloration o... [more] HCS2018-73
pp.37-41
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2018-12-06
13:25
Hiroshima Satellite Campus Hiroshima Evaluation of Flexible Test Power Control for Logic BIST in TEG Chips
Takaaki Kato (KIT), Senling Wang (Ehime Univ.), Yasuo Sato, Seiji Kajihara (KIT) VLD2018-57 DC2018-43
Scan-based logic BIST has a crucial problem of high test power dissipation. Its solution requires a flexible test power ... [more] VLD2018-57 DC2018-43
pp.125-130
EMD, LQE, OPE, CPM, R 2018-08-24
10:50
Hokkaido Otaru Camber of Commerce & Industry Compact and low power consumption mid-IR quantum cascade laser development and gas sensing application
Makoto Murata, Hiroyuki Yoshinaga, Masaki Migita, Hiroki Mori, Yukihiro Tsuji, Takashi Kato, Jun-ichi Hashimoto, Mitsuru Ekawa, Yasuhiro Iguchi, Tsukuru Katsuyama (Sumitomo Electric) R2018-27 EMD2018-30 CPM2018-30 OPE2018-57 LQE2018-46
Mid-infrared sensing with a quantum cascade laser (QCL) as a light source is expected to offer high sensitivity, short m... [more] R2018-27 EMD2018-30 CPM2018-30 OPE2018-57 LQE2018-46
pp.53-56
AI 2017-11-24
16:20
Fukuoka   Sleep Pattern Modelling for Quality Prediction based on Sound Data
Hongle Wu, Takafumi Kato, Masayuki Numao, Ken-ichi Fukui (Osaka Univ.) AI2017-17
 [more] AI2017-17
pp.61-66
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2017-11-07
09:00
Kumamoto Kumamoto-Kenminkouryukan Parea Flip-Flop Selection for Multi-Cycle Test with Partial Observation in Scan-Based Logic BIST
Shigeyuki Oshima, Takaaki Kato (Kyutech), Senling Wang (Ehime Univ.), Yasuo Sato, Seiji Kajihara (Kyutech) VLD2017-41 DC2017-47
A logic BIST scheme using multi-cycle test with partial observation has been proposed. In the scheme, the selection of f... [more] VLD2017-41 DC2017-47
pp.85-90
MI 2017-01-18
15:48
Okinawa Tenbusu Naha [Short Paper] PET image analysis using sparse nonnegative matrix factorization for accumulation model survey of amyloid beta
Tatsuya Nagata, Hidekata Hontani, Tatsuya Yokota (NIT), Yuchi Kimura (Kindai Univ.), Koichi Ito (Tohoku Univ.), Takashi Kato, Kaori Iwata, Akinori Nakamura (NCGG) MI2016-117
(To be available after the conference date) [more] MI2016-117
pp.183-184
DC 2015-12-18
13:20
Niigata Kurieito Mulakami (Murakami City) On Measurement of On-Chip Temperature And Voltage Variation Using A Digital Monitor
Yousuke Miyake, Takaaki Kato, Takuya Itonaga, Yasuo Sato, Seiji Kajihara (KIT) DC2015-74
A digital monitor for measuring a temperature and a voltage of VLSIs is proposed. The monitor can derive measurement res... [more] DC2015-74
pp.5-10
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2013-11-29
09:20
Kagoshima   Design and evaluation of circuits to control scan-in power in logic BIST
Takaaki Kato, Takeru Kina, Yousuke Miyake, Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech.) VLD2013-93 DC2013-59
Power reduction during Logic BIST is a crucial problem; however, power controlling technologies are required as well as ... [more] VLD2013-93 DC2013-59
pp.233-238
DC 2012-06-22
15:45
Tokyo Room B3-1 Kikai-Shinko-Kaikan Bldg An Evaluation of Low Power BIST Method
Yasuo Sato, Senling Wang, Takaaki Kato, Kohei Miyase, Seiji Kajihara (Kyutech) DC2012-14
Low-power test technology has been investigated deeply to achieve an accurate and efficient testing. Although many sophi... [more] DC2012-14
pp.33-38
ICM, IPSJ-IOT, IPSJ-CSEC 2012-05-11
11:15
Akita Akita University A method of Management and Operation on Network as a Service (NaaS)
Tsunemasa Hayashi, Tatsuya Kato (midokura) ICM2012-10
 [more] ICM2012-10
pp.117-120
DC 2012-02-13
11:55
Tokyo Kikai-Shinko-Kaikan Bldg. A method to reduce shift-toggle rate for low power BIST
Takaaki Kato, Senling Wang, Kohei Miyase, Yasuo Sato, Seiji Kajihara (KIT) DC2011-80
Logic BIST using scan design has a problem with high power dissipation during test. In this work we propose a method tha... [more] DC2011-80
pp.25-29
EMT, PN, LQE, OPE, MWP, EST, IEE-EMT [detail] 2012-01-26
16:30
Osaka Osaka Univ. Convention Center Mid-IR vertical transition DFB quantum cascade laser
Jun-ichi Hashimoto, Yukihiro Tsuji, Hiroshi Inada, Takamitsu Miura, Makoto Murata, Hiroyuki Yoshinaga, Hideki Yagi, Takashi Kato, Michio Murata, Tsukuru Katsuyama (SEI) PN2011-50 OPE2011-166 LQE2011-152 EST2011-100 MWP2011-68
We designed a new vertical-transition active layer structure for a Mid-IR quantum cascade laser (QCL). In this structure... [more] PN2011-50 OPE2011-166 LQE2011-152 EST2011-100 MWP2011-68
pp.109-113
SANE 2011-04-21
13:50
Nagano Usuda Deep Space Center, JAXA A Prototype of a 500W-Class Compact Waveguide Combiner by GaN Power Amplifier Units for S-Band Space Communication
Hirofumi Noji, Masakazu Hori, Yasuhiro Shibuya, Kosuke Isono (Tokyo Univ. of Science), Yuta Kobayashi (JAXA), Mitsuo Yamada (SED), Toshio Ishizaki (Ryuukoku Univ.), Sigeki Furuta, Yukio Moriguti (NETS), Tadashi Kawai (HPU), Kenjiro Nishikawa (Kagoshima Univ.), Takaji Kato, Zenichi Yamamoto, Shigeo Kawasaki (JAXA) SANE2011-3
 [more] SANE2011-3
pp.13-17
HCGSYMPO
(2nd)
2010-12-15
- 2010-12-17
Miyazaki Miyazaki Seagai resort Proposal of Presentation Method for Routes to Evacuation Sites
Shigeru Mukaida, Taku Kato (Hokkaido Information Univ.), Takashi Kato (Kansai Univ.), Mitsutaka Yasuda (Hokkaido Information Univ.)
Evacuation sites are designated for local residents to evacuate to safety in case of disasters such as earthquakes. How... [more]
MBE 2010-09-28
14:00
Nagano Shinsyu University Characterization of Hemodialysis Shunt Murmurs with Wavelet Transformation and Classification by Self-Organizing Map
Toru Yamaki, Hatsuhiro Kato, Yutaka Suzuki, Mizuya Fukasawa, Osamu Sakata (Yamanashi Univ.), Asobu Hattori (TMITRI), Takaya Kato (Yamanashi Univ.) MBE2010-22
It is important for renal hemodialysis patients to discover stenosis of shunted blood vessel at an early stage. An essen... [more] MBE2010-22
pp.1-6
 Results 1 - 20 of 26  /  [Next]  
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan