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=============================================== Technical Committee on Reliability (R) Chair: Mitsuhiro Kimura (Hosei Univ.) Vice Chair: Hiroyasu Mawatari (NTT) Secretary: Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.) Assistant: Nobuyuki Tamura (Hosei Univ.), Maratt Zanikef (Kyushu Inst. of Tech.) =============================================== Technical Committee on Electromechanical Devices (EMD) Chair: Makoto Hasegawa (Chitose Inst. of Science and Tech.) Vice Chair: Junya Sekikawa (Shizuoka Univ.), Nobuhiro Kuga (Yokohama National Univ.) Secretary: Yasuhiro Hattori (Sumitomo Denso), Yoshiteru Abe (NTT) Assistant: Takahiro Ueno (Nippon Inst. of Tech.) DATE: Fri, Feb 21, 2014 13:00 - 17:15 PLACE: TOPICS: ---------------------------------------- Fri, Feb 21 PM (13:00 - 17:15) ---------------------------------------- ----- Opening AddressBreak ( 5 min. ) ----- (1) 13:05 - 13:30 The current international standardization on reliability analysis for relays -- Progress of activities in IEC/TC94 -- Takeshi Aoki (TKG), Yoshihisa Oikawa (Tyco electronics Japan) (2) 13:30 - 13:55 Characteristics of Electric Contact Behavior in Boundary Arc Area -- (IV) Oxidative Condition of Siloxane -- Yoshiro Yoshida (ALPS Electric) (3) 13:55 - 14:20 Three-dimensional comparisons of damage shapes on Ag and AgSnO2 contact surfaces caused by break arc discharges Makoto Hasegawa, Daichi Kawamura (Chitose Inst. of Science and Tech.) ----- Break ( 10 min. ) ----- (4) 14:30 - 14:55 Effect of self-magnetic field on current flowing through true contact area Terutaka Tamai (Elcontech), Shigeru Sawada, Yasuhiro Hattori (AutoNetworks) (5) 14:55 - 15:20 Study on contact oil in electrical contacts Koji Kojima, Kazuo Iida (Mie Univ.), Shigeru Sawada (ANTech) (6) 15:20 - 15:45 HomeBox Virtual: A New Paradigm for End-to-End Services Based on VM Visitation Platforms Marat Zhanikeev (Kyushu Inst. of Tech.) ----- Break ( 10 min. ) ----- (7) 15:55 - 16:20 Reliability assessment of the electromagnetic noise from fluorescent lighting equipment Kazuaki Wakai (Diichi Inst. of Tech.) (8) 16:20 - 16:45 Study on HPCF connector attenuation (2) Tadahisa Iikubo, Ryo Nagase (Chiba Inst. of Tech.) (9) 16:45 - 17:10 Pressure sensing technique using Band-pass filter On Fiber-end (3) Kentaro Matsuda, Ryo Nagase (Chiba Inst. of Tech.) ----- Closing Address ( 5 min. ) ----- # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, May 23, 2014: [Wed, Mar 12] # SECRETARY: Akira Asato (FUJITSU) E-mail: a          === Technical Committee on Electromechanical Devices (EMD) === # FUTURE SCHEDULE: Fri, Mar 7, 2014: Yokohama Nat'l Univ. [Wed, Jan 15] Fri, May 16, 2014: Ｉｓｈｉｎｏｍａｋｉ Senshu University [Wed, Mar 5] # SECRETARY: Junya Sekikawa (Shizuoka Univ.) TEL (053) 478-1618、FAX (053) 478-1618 E-mail: tj   kipc    Nobuhiro Kuga（Yokohama National Univ.） TEL (045)339-4279、FAX (045)339-4279 E-mail:   y Yasuhiro Hattori（Sumitomo Wiring Systems, Ltd.) TEL (059)382-8634、FAX (059)382-8591 E-mail:     - t  sws Yoshiteru Abe（NTT Photonics Lab.)] TEL (046)240-2262、FAX (046)270-6421 E-mail: abe     # ANNOUNCEMENT: # Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/ Last modified: 2013-12-13 12:40:41 |
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