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=============================================== Technical Committee on Reliability (R) Chair: Akira Asato (Fujitsu) Vice Chair: Tadashi Dohi (Hiroshima Univ.) Secretary: Nobuyuki Tamura (Hosei Univ.), Shinji Inoue (Kansai Univ.) Assistant: Hiroyuki Okamura (Hiroshima Univ.), Shinji Yokogawa (Univ. of Electro-Comm.) DATE: Thu, Nov 28, 2019 13:45 - 16:50 PLACE: Central Electric Club, Room #215(2-1-25, Dojimahama, Kita-ku, Osaka, Osaka 530-004. 12-minute walk distance from JR-Osaka Station, 6-minute walk distance from JR-Kitashinchi Station. https://www.chuodenki-club.or.jp. Prof. Shinji Inoue. +81-6-6345-6351) TOPICS: Reliability of semiconductor and electronic devices, Reliability general ---------------------------------------- Thu, Nov 28 PM (13:45 - 16:50) ---------------------------------------- (1) 13:45 - 14:10 A Note on Moment-Based Approximation for Uncertainty Propagation in Hierarchical Models Jiahao Zhang (Hiroshima Univ.), Junjun Zheng (Ritsumeikan Univ.), Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.) (2) 14:10 - 14:35 Non-homogeneous Markov Process Modeling for Software Reliability Assessment Siqiao Li, Tadashi Dohi, Hiroyuki Okamura (Hiroshima U.) (3) 14:35 - 15:00 Process-Oriented Software Reliability Modeling with Debugging Difficulties Shinji Inoue (Kansai Univ.), Shigeru Yamada (Tottori Univ.) ----- Break ( 10 min. ) ----- (4) 15:10 - 15:35 Research on improving the wettability of tin by forming a monolayer on the surface Takumi Hakozaki, Torann Minn Huku, Hiroyuki Saito (Tokyo Denki Univ.) (5) 15:35 - 16:00 A Note on Optimal Rejuvenation Policies for Non-Markovian Availability Models with Aperiodic Checkpointing Junjun Zheng (Ritsumeikan Univ.), Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.) (6) 16:00 - 16:25 Present Situation and Practical Issues on Functional Safety Software Development Takaji Fujiwara (SRATECH Lab), Shinji Inoue (Kansai Univ.) (7) 16:25 - 16:50 Reliability Methodologies for Degradation Predictions Based on Hierarchical Bayesian Modeling and Machine Learning Toru Kaise, Toyohiko Egami (Univ. of Hyogo) # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, Dec 13, 2019: Kikai-Shinko-Kaikan Bldg. [Wed, Oct 16] Fri, Feb 14, 2020: [Thu, Dec 19] # SECRETARY: Hiroyuki Okamura (Hiroshima Univ.) E-mail:        -u Last modified: 2019-09-19 10:51:12 |
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