|
|
| Chair |
|
Shigeru Yanagi |
| Vice Chair |
|
Kazuaki Wakai |
| Secretary |
|
Tetsushi Yuge, Mitsuhiro Kimura |
| Assistant |
|
Naoto Kaio, Hisoyasu Mawatari |
|
| Conference Date |
Fri, Sep 14, 2007 10:30 - 15:50 |
| Topics |
For LSI, evaluation, fault diagnosis, physical analysis and quality |
| Conference Place |
Kochi University of Technology |
| Address |
Miyanokuchi 185,Tosayamada-cho,Kami-shi,Kochi,782-8502,JAPAN |
| Transportation Guide |
http://www.kochi-tech.ac.jp/kut_J/access/index.html |
Contact
Person |
Prof. Masaru Sanada
0887-57-2118 |
| Sponsors |
This conference is co-sponsored by EEE Reliability Society Japan Chapter and Reliability Engineering Association of Japan.
|
Fri, Sep 14 AM
10:30 - 15:50 |
| (1) |
10:30-10:55 |
Material Processing by Microplasma in SEM |
Hidenori Ohi, Yasuaki Okazaki, Tomoyoshi Takahashi, Akimitsu Hatta (Kochi Univ. Technol.) |
| (2) |
10:55-11:20 |
Fault logic trace by Using Transistor Operating Point Analysis
-- Diagnosis of Feed Back Fault with Oscillating Phenomenon -- |
Masaru Sanada, Tonoya Nakamura, Keishi Hashida (KUT) |
| (3) |
11:20-11:45 |
An idea of fault model by RC network, and the transistor level fault diagnosis trial. |
Yutaka Yoshizawa (NEC Electoronics) |
| |
11:45-13:10 |
Lunch Break ( 85 min. ) |
| (4) |
13:10-13:40 |
[Invited Talk]
The Latest Trend of Defect Modeling in LSI Diagnosis
-- Tutorial -- |
Yasuo Sato (Hitachi) |
| (5) |
13:40-14:05 |
An expanded Per-Test X-Fault Diagnosis Method for LSI Circuits |
Yusuke Nakamura, Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara (KIT), K. K. Saluja (Univ. of Wisconsin) |
| (6) |
14:05-14:30 |
Evaluation of transmission line for LSI tester and simulation modeling |
Hidekazu Tsuchiya, Takeshi Asakawa (Tokai univ.), Masayuki Sato (Genesis technology) |
| |
14:30-15:00 |
Break ( 30 min. ) |
| (7) |
15:00-15:25 |
The failure analyses and the article of good quality analysis of the electronic component
-- The efforts for the reliability improvement of the electronic component which is for automobile use -- |
Yasuo Imai, Ｄａｉｋｉ Ｔａｎａｋａ (ＯＥＧ) |
| (8) |
15:25-15:50 |
Structural analysis as quality evaluation of LSI manufacturing. |
Masahito Kajinuma, Akira Mizoguchi, Koichirou Takeuchi (MELCO) |
| Announcement for Speakers |
| General Talk (25) | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| R |
Technical Committee on Reliability (R) [Latest Schedule]
|
| Contact Address |
Tetsushi Yuge (National Defense Academy)
TEL +81-46-841-3810
FAX +81-46-844-5903
E- :  ge n  |
Last modified: 2007-08-27 09:13:42
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