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=============================================== Technical Committee on Reliability (R) Chair: Tetsushi Yuge (National Defense Academy) Vice Chair: Akira Asato (Fujitsu) Secretary: Nobuyuki Tamura (Hosei Univ.), Shigeto Hiraguri (RTRI) Assistant: Shinji Inoue (Kansai Univ.), Hiroyuki Okamura (Hiroshima Univ.) DATE: Thu, Nov 16, 2017 14:00 - 16:45 PLACE: (http://www.chuodenki-club.or.jp/) TOPICS: ---------------------------------------- Thu, Nov 16 PM (14:00 - 16:45) ---------------------------------------- (1) 14:00 - 14:25 A Study for Accelerated Humidity Stress Test Sadanori Ito (Itoken) (2) 14:25 - 14:50 The Electrochemical Migration Test Using Condensation Cycle Test Takaaki Semba, Katsuyuki Ishizu, Takafumi Fujisawa (MMC) (3) 14:50 - 15:15 The study of Acceleration model Based on the Step Stress test Toshinari Matsuoka (Mitsubishi Electric) ----- Break ( 15 min. ) ----- (4) 15:30 - 15:55 Effects on Stresses in HALT Raphael Pihet, Takuya Hirata, Hideki Kawai, Aoki Yuichi (ESPEC) (5) 15:55 - 16:20 Weak Points Detection of Products by Multiple Power Cycling Test katsuyuki Ishizu (MMC), Hiroaki Nishikawa (KMM) (6) 16:20 - 16:45 Bayesian Reliability Analysis Based on Degradation Data Toru Kaise (Univ. of Hyogo) # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by Kansai Branch of Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, Dec 15, 2017: Kikai-Shinko-Kaikan Bldg. [Mon, Oct 16] Fri, Feb 16, 2018: Sumitomo Wiring Systems [Fri, Dec 15] # SECRETARY: Hiroyuki Okamura (Hiroshima Univ.) E-mail:     l     -u Last modified: 2017-09-20 16:29:46 |
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