Thu, May 9 PM
14:30 - 16:10 |
| |
14:30-14:40 |
( 10 min. ) |
| (1) |
14:40-15:10 |
Detection of Security Threats Using Patterns of Sequence Diagrams |
Tatsuya Abe, Shinpei Hayashi, Motoshi Saeki (Tokyo Inst. of Tech.) |
| (2) |
15:10-15:40 |
An Automatic Programming System By Composition of Reusable Program Components for Java Software |
Kazuhiro Uenosono (Aoyama Gakuin Univ.), Seiichi Komiya (NII) |
| (3) |
15:40-16:10 |
An Empirical Evaluation of Slice-based Cohesion Approaches to Supporting Extract Method |
Kaku Yamaguchi (Osaka Univ.), Norihiro Yoshida (NAIST), Akira Goto, Katsuro Inoue (Osaka Univ.) |
| |
16:10-16:20 |
Break ( 10 min. ) |
Thu, May 9 PM
16:20 - 17:50 |
| (4) |
16:20-16:50 |
Detecting Extract Method Refactoring from Repository with Syntactic Information |
Kenji Fujiwara, Norihiro Yoshida, Hajimu Iida (NAIST) |
| (5) |
16:50-17:20 |
Using fine grain version data to support software development rework. |
Koichi Umekawa, Hiroshi Igaki (Osaka Univ.), Norihiro Yoshida (NAIST), Katsuro Inoue (Osaka Univ.) |
| (6) |
17:20-17:50 |
Dividing commits based on classification of modifications |
Noa Kusunoki, Keisuke Hotta, Yoshiki Higo, Shinji Kusumoto (Osaka Univ.) |
Thu, May 9 PM
17:50 - 18:10 |
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|
Fri, May 10 AM
09:00 - 10:30 |
| (7) |
09:00-09:30 |
A Case study on How Clone Author and User Interact in Software Repository |
Takuya Moriwaki, Hiroshi Igaki, Yuki Yamanaka (Osaka Univ.), Norihiro Yoshida (NAIST), Katsuro Inoue, Shinji Kusumoto (Osaka Univ.) |
| (8) |
09:30-10:00 |
A Code-Clone Detection Method from Bytecode Based on Arbitrary-Granularity Function Model |
Toshihiro Kamiya (Future Univ. Hakodate) |
| (9) |
10:00-10:30 |
A Research on Evolution of Repeated Code in Program Source Code |
Ayaka Imazato, Yui Sasaki, Yoshiki Higo, Shinji Kusumoto (Osaka Univ.) |
| |
10:30-10:45 |
Break ( 15 min. ) |
Fri, May 10 AM
10:45 - 12:15 |
| (10) |
10:45-11:15 |
Deriving Baseline Metric Values for Third-party Assessment of Software Quality |
Daichi Urata, Yusuke Fujihara, Rikichi Hirayama, Kazuki Hamasaki, Norihiro Yoshida, Hajimu Iida (NAIST) |
| (11) |
11:15-11:45 |
Influence of Organizational Change on Product Metrics and Defects |
Seiji Sato, Hironori Washizaki, Yoshiaki Fukazawa (Waseda Univ.), Sakae Inoue, Hiroyuki Ono, Yoshiiku Hanai, Mikihiko Yamamoto (Fujitsu) |
| (12) |
11:45-12:15 |
An investigation of relationship between lines of comments and fault-proneness in small-sized programs |
Hirohisa Aman (Ehime Univ.) |
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