Fri, Feb 15 AM 10:30 - 16:20 |
|
10:30-10:40 |
Opening Address ( 10 min. ) |
(1) |
10:40-11:05 |
Development of Simple ESD Checker and it's Application
-- Detection of ESD Checker and it's Application -- |
Norio Yamasaki, Masaru Sanada (KUT) |
(2) |
11:05-11:30 |
Reliability design and applications for the Non power supply type optical transmission unit |
Yoshikazu Toba (Seikoh Giken), Kazuaki Wakai (ITEC) |
|
11:30-13:00 |
Lunch ( 90 min. ) |
(3) |
13:00-13:25 |
Decomposition process of silicone and electrical contact failure
-- Influence of silicone contamination on contact devices -- |
Terutaka Tamai (Mie Univ.), Yasuhiro Hattori, Hirosaka Ikeda (ANT) |
(4) |
13:25-13:50 |
Degradation phenomenon of electrical contacts by 3-D oscillating mechanism
-- 3-D oscillating mechanism for trial -- |
Shin-ichi Wada, Hiroshi Amao, Hiroto Minegishi, Keiji Koshida, Taketo Sonoda, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio Univ.) |
(5) |
13:50-14:15 |
Contact Resistance Characteristics of Tin Plated Contacts with Switching Operation and Surface Observation |
Shinya Nakamura, Yuji Yamashita, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetwork) |
(6) |
14:15-14:40 |
Study of Behavior of Contact Resistance of Fretting Corrosion |
Naoyuki Sato, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (AutoNetworks) |
|
14:40-14:55 |
Break ( 15 min. ) |
(7) |
14:55-15:20 |
Accuracy Improvement of Dual Wavelength Push-pull Reflectometry (DWPR) Using a Total Reflector |
Yasutoshi Komatsu, Keiichi Inoue, Seiichi Onoda (Watanabe Co.,Ltd.,), Nobuo Tsukamoto (DSP Technology Associaetes, Inc.) |
(8) |
15:20-15:45 |
The investigation of the material for hermetic sealing
-- About gas permeation of materials -- |
Tetsuo Hayase, Ichizo Sakamoto (OC.) |
(9) |
15:45-16:10 |
Reliability of Optical Connector Assembled with Instant Adhesive |
Shuichi Yanagi, Shinsuke Matsui, Shigeru Hosono, Ryo Nagase (NTT) |
|
16:10-16:20 |
Break ( 10 min. ) |
Fri, Feb 15 16:20 - 17:15 |
(10) |
16:20-17:10 |
[Special Talk]
Holography and Its Application to Reliability Evaluation of the Electromechnical Devices |
Masanari Taniguchi (Tohoku Bunka Gakuen University) |
|
17:10-17:15 |
Closing Address ( 5 min. ) |