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=============================================== Technical Committee on Electromechanical Devices (EMD) Chair: Ryo Nagase (Chiba Inst. of Tech.) Vice Chair: Kiyoshi Yoshida (Nippon Inst. of Tech.) Secretary: Makoto Hasegawa (Chitose Inst. of Science and Tech.), Junya Sekikawa (Shizuoka Univ.) Assistant: Yasuhiro Hattori (Sumitomo Denso) =============================================== Technical Committee on Reliability (R) Chair: Naoto Kaio (Hiroshima Shudo Univ.) Vice Chair: Yasunori Kimura (Fujitsu Labs.) Secretary: Mitsuhiro Kimura (Hosei Univ.), Hiroyasu Mawatari (NTT) Assistant: Akira Asato (Fujitsu), Nobuyuki Tamura (National Defense Academy) DATE: Fri, Feb 19, 2010 12:35 - 17:00 PLACE: TOPICS: ---------------------------------------- Fri, Feb 19 PM (12:30 - 17:00) ---------------------------------------- ----- Opening Address ( 5 min. ) ----- (1) 12:35 - 13:00 Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Modeling of the oscillating mechanism (7) -- Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (former Keio Univ/Nippon Inst. of Tech.) (2) 13:00 - 13:25 A Study on Improvement for Seal property of Electromechanical Devices -- The behavior of One-Part Epoxy Resin in a narrow gap -- Osamu Otani, Seiji Nakajima, Tomohiro Fukuhara (OMRON Corp.) (3) 13:25 - 13:50 An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts (III) Makoto Hasegawa (Chitose Inst. of Sci. and Tech.), Yoshiyuki Kohno (Kaneka Corp.) ----- Break ( 10 min. ) ----- (4) 14:00 - 14:25 Optical Beam Profiler using Perturbation Interruption Method Seiichi Onoda, Keiichi Inoue, Koji Aita, Masayuki Nakano (Watanabe Co., Ltd) (5) 14:25 - 14:50 Accuracy Improvement of BOF/DWPR Temperature Sensing Using a Reference BOF Yasutoshi Komatsu, Ryuji Nagai, Keiichi Inoue, Seiichi Onoda (Watanabe Co., Ltd) (6) 14:50 - 15:15 Cut Set Analysis of Fault Tree with Priority AND Gates Taijirou Yoneda, Tetsushi Yuge, Nobuyuki Tamura, Shigeru Yanagi (NDA) ----- Break ( 5 min. ) ----- (7) 15:20 - 15:45 Observation of wear status of tin plating for automotive connector at initial stage of sliding Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.), Kazuo Iida (Mie Univ.) (8) 15:45 - 16:10 Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance Yuya Nabeta, Shigeru Sawada, Yasushi Saitoh (Mie Univ.), Atsushi Shimizu, Yasuhiro Hattori (AutoNet Tech.), Terutaka Tamai (Mie Univ.) (9) 16:10 - 16:35 A Study on growth of hair silver Sadanori Ito (Formerly OMRON), Takahumi Sasaki (OMRON), Hiroki Yamaguchi (OMRON RELAY AND DEVUCE) (10) 16:35 - 17:00 Measurement Of Electrical Property Of Sn Oxide Layer Using Liquid Metal Tomoki Yonekawa, Yasushi Saitoh, Kazuo Iida, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech. Ltd) ----- Closing Address ( 5 min. ) ----- # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan. === Technical Committee on Electromechanical Devices (EMD) === # FUTURE SCHEDULE: Fri, Mar 5, 2010: Yokohama National University [Mon, Jan 18], Topics: Short note (Graduation thesis and master's thesis) Apr, 2010: Recess Fri, May 21, 2010: Akita Univ. [Mon, Mar 15] # SECRETARY: Makoto Hasegawa（Chitose Inst. of Science and Technorogy） TEL (0123)27-6059、FAX (0123)27-6059 E-mail:      p  n   Junya Sekikawa (Shizuoka Univ.) TEL (053) 478-1618、FAX (053) 478-1618 E-mail: tj  kipc   Yasuhiro Hattori（Sumitomo Wiring Systems, Ltd.) TEL (059)382-8970、FAX (059)382-8591 E-mail:     -t  sws # ANNOUNCEMENT: # Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/ === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, Apr 16, 2010: Kikai-Shinko-Kaikan Bldg. [Fri, Feb 12] Fri, May 28, 2010: [Fri, Mar 19] # SECRETARY: Kimura, Mitsuhiro (Hosei Univ.) TEL 042-387-6116 FAX 042-387-6126 E-mail: miLast modified: 2009-12-17 09:25:11 |
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