Fri, Jan 18 AM Regular session 1 10:45 - 12:05 |
|
10:45-10:50 |
Opening Address ( 5 min. ) |
(1) |
10:50-11:15 |
Results of EMC round robin test on emission and immunity test.
-- (3) Conducted immunity round robin test -- |
Yoshitsugu Okuda (KEC Electronic Industry Development Center), Yasushi Asaji (Murata Manufacturing), Takashi Usui (YAMAHA), Mikio Okumura (OMRON), Kazuhiro Kobayashi (IPS), Hiroyoshi Shida (Tokin EMC Engineering), Hisashi Ninomiya (Roland), Mitsuyoshi Maishima (Hamamatsu Photonics), Osami Wada (Kyoto Univ) |
(2) |
11:15-11:40 |
Improvement of Prediction Accuracy by Improving Parameters Extraction in 2-port Noise-source Equivalent Circuit Model of DC/DC Converter |
Yuhei Osaki, Yusuke Yano, Taishi Uematsu, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) |
(3) |
11:40-12:05 |
Study on moisture sensor for landslide monitoring Ⅱ |
Shion Baba, Toshiyuki Tanaka, Noya Hirata, Tkahumi Fujimoto, Takahiro Hirano (Nagasaki Univ) |
|
12:05-13:15 |
Lunch Break ( 70 min. ) |
Fri, Jan 18 PM Regular session 2 13:15 - 15:00 |
(4) |
13:15-13:40 |
Internal Electric Field for Uniform Magnetic Field Exposure in Low Frequency and Intermediate Frequency Range |
Katsuaki Aga, Akimasa Hirata (NITech) |
(5) |
13:40-14:05 |
Variation of estimation accuracy by difference between shape and heterogeneity of model for EEG brain wave source localization |
Yuki Osachi, Takahiro Ito, Akimasa Hirata (NITech) |
(6) |
14:05-14:30 |
Study on Far-End Cross Talk reduction technology in Microstrip-line
-- Attached Capacitor Value -- |
Yoshiaki Mori, Sinichi Sasaki (Saga Univ) |
(7) |
14:30-14:55 |
Examination of reduction technique for radiation noise from the power supply layers in PCB
-- Evaluation by actual measurement -- |
Kazuki Fueta, Shinichi Sasaki (Saga Univ.) |
|
14:55-15:00 |
Closing Address ( 5 min. ) |