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Technical Committee on Reliability (R)
Chair: Hiroyasu Mawatari (NTT) Vice Chair: Tetsushi Yuge (National Defense Academy)
Secretary: Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.)
Assistant: Maratt Zanikef (Kyushu Inst. of Tech.), Nobuyuki Tamura (Hosei Univ.)

Fri, Jun 17, 2016 13:30 - 15:15


Reliability for electronics and electronic devices, Failure analysis, Overall reliability engineering

Fri, Jun 17 PM (13:30 - 15:15)

(1) 13:30 - 13:55
A Note on Parameter Estimation for Cox Regression Based Software Reliability Models
Hiroyuki Okamura, Akihide Ito, Tadashi Dohi (Hiroshima Univ.)

(2) 13:55 - 14:20
Replacement-Opportunity Correlated Failure Models
Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.)

----- Break ( 5 min. ) -----

(3) 14:25 - 14:50
Structural properties of an optimal maintenance policy for a partially observable Markovian deteriorating system with imperfect repair
Nobuyuki Tamura (Hosei Univ.)

(4) 14:50 - 15:15
The Study of Electroless Nickel Plating -Surface Morphology and Hardening Behavior-
Rieko Mizuuchi, Yuji Hisazato, Kazuya Kodani (Toshiba)

# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.

- This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.

=== Technical Committee on Reliability (R) ===

Fri, Jul 29, 2016: Otaru Chamber of Commerce and Industry [Mon, May 16], Topics: Reliability theory, Reliability for communication network, Overall reliability engineering
Thu, Aug 25, 2016 - Fri, Aug 26, 2016 (tentative): [Thu, Jun 16]

Hiroyuki Okamura (Hiroshima Univ.)

Last modified: 2016-04-19 16:56:37

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