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Technical Committee on Reliability (R)
Chair: Hiroyasu Mawatari (NTT) Vice Chair: Tetsushi Yuge (National Defense Academy)
Secretary: Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.)
Assistant: Maratt Zanikef (Kyushu Inst. of Tech.), Nobuyuki Tamura (Hosei Univ.)

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Technical Committee on Electromechanical Devices (EMD)
Chair: Yoshiteru Abe (NTT)
Secretary: Shigeru Sawada (Sumitomo Denso), Kenji Suzuki (Fujielectric)
Assistant: Yoshiki Kayano (Univ. of Electro-Comm.), Yuichi Hayashi (Tohoku Gakuin Univ.)

DATE:
Fri, Feb 17, 2017 12:50 - 17:30

PLACE:
(http://www.omron.co.jp/about/corporate/location/factory/kusatsu.html)

TOPICS:

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Fri, Feb 17 PM (12:50 - 17:30)
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----- Opening Address ( 10 min. ) -----

(1) 13:00 - 13:20
Properties of contact lubricant under high temperature and contact resistance
Terutaka Tamai (Elcontech), Masahiro Yamakawa (TETRA)

(2) 13:20 - 13:40
The Investigation of Graphene Film as a New Electrical Contact Material
Kikuo Mori, Hajime Takada (YZK), Tetsuo Shimizu, Sumiko Kawabata, Miyuki Tanaka, Toshitaka Kubo (AIST)

(3) 13:40 - 14:00
Contorol of sliding wear for thin film sliding contacts.
Yuki Yamamoto, Yoshihiro Umeuchi (Omron), Makito Morii (OES)

(4) 14:00 - 14:20
Effect of Hardness on Wear and Abrasion Resistance of Silver Plating on Copper Alloy
Shigeru Sawada (SEI), Song-zhu Kure-chu, Rie Nakagawa, Toru Ogasawara, Hitoshi Yashiro (Iwate Uni.), Yasushi Saitoh (AN-Tech)

----- Break ( 10 min. ) -----

(5) 14:30 - 14:50
Study on micro vibration sensing technique using Fabry-Perot interferometer with optical fibers
Kaoru Kuribayashi, Ryo Nagase (CIT)

(6) 14:50 - 15:10
Fiber-optic measurement of sap consistency (5)
Masashi Iida, Ryo Nagase (CIT)

(7) 15:10 - 15:30
(See Japanese page.)

(8) 15:30 - 15:50
A Study on Breakdown caused by Inorganic Phosphate and the Countermeasures
sadanori ito (itoken)

----- Break ( 10 min. ) -----

(9) 16:00 - 16:20
Study on the Relation between Filler of the Adhesive and Functions of Mechanical Devices
Osmau Ohtani, Tomohiro Fukuhara (Omron Corp.)

(10) 16:20 - 16:40
DC300 V-150 A arcless current interruption by using arcless hybrid DC circuit breaker
Tatsuya Hayakawa, Kyotaro Nakayama, Shungo Zen, Koichi Yasuoka (Titech)

(11) 16:40 - 17:00
Effect of various resin materials on arc duration under magnetic field
Daisuke Okazaki (OMRON), Masayuki Noda (OMRON Relay and Device)

(12) 17:00 - 17:20
Report on thermal simulation technique to analyze effect of contact bounce arc.
Kazua Murakami, Takeshi Nishida (Omron), Tetsuo Shinkai (OER)

----- Closing Address ( 10 min. ) -----

# Information for speakers
General Talk will have 15 minutes for presentation and 5 minutes for discussion.

# CONFERENCE SPONSORS:
- This conference is co-sponsored by Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.

=== Technical Committee on Reliability (R) ===
# FUTURE SCHEDULE:

Fri, May 26, 2017: Purity Makibi [Fri, Mar 17], Topics: Software Reliability, Overall reliability engineering

# SECRETARY:
Hiroyuki Okamura (Hiroshima Univ.)
E-mail:

-u

=== Technical Committee on Electromechanical Devices (EMD) ===
# FUTURE SCHEDULE:

Fri, Mar 3, 2017: [Tue, Jan 17]
Fri, May 19, 2017: Chitose Arcadia Plaza [Fri, Mar 17]

# SECRETARY:
Yoshiteru Abeabe (NTT)
TEL +81-46-240-2262、FAX +81-46-270-6421
E-mail: abe