Fri, Nov 25 AM Young Scientists Meeting Session 1
10:00 - 11:45 |
| |
10:00-10:05 |
Opening Address ( 5 min. ) |
| (1) |
10:05-10:30 |
Pulse Coding Controlled Switching Converter with Variable Notch Characteristic in Spread Spectrum |
Takuya Arafune, Nobukazu Tsukiji, Koji Asami, Yasunori Kobori, Haruo Kobayashi (Gunma Univ.) |
| (2) |
10:30-10:55 |
Radiated Emission Analysis with Electromagnetic Simulation for Printed Circuit Boards |
Kodai Katagiri, Norihiko Akashi, Sotome Hideyuki, Takaya Muto (Mitsubishi Electric Corp.) |
| (3) |
10:55-11:20 |
Influence of Semi-anechoic Chamber to magnetic field in low frequnecy |
Kazuma Kawai, Seiji Nagakusa, Kazutaka Murasato, Takashi Naoi, Michihira Iida, Katsumi Nakamura (DENSO) |
| (4) |
11:20-11:45 |
A Study on Embedded Multi-Layer F-SIR Structure for Wideband Negative Group Delay Characteristics |
Ryuji Sasaki (Akita Univ.), Yoshiki Kayano (UEC), Motoshi Tanaka (Akita Univ.) |
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11:45-13:00 |
Lunch Break ( 75 min. ) |
Fri, Nov 25 PM Young Scientists Meeting Session 2
13:00 - 14:15 |
| (5) |
13:00-13:25 |
Shielding design of EMI filter for power electronic converter using electromagnetic simulations |
Keita Takahashi, Yuichiro Murata, Yusuke Tsubaki (Mitsubishi Electric), Tetsuro Fujiwara (Mitsubishi Electric Engineering), Hideto Maniwa, Naohisa Uehara (Mitsubishi Electric) |
| (6) |
13:25-13:50 |
Feasibility of Electromagnetic Shield with Low Reflectivity and Transmissivity by Approximation of Perfectly Matched Layer |
Riku Sato (Akita Univ.), Yoshiki Kayano (UEC), Motoshi Tanaka (Akita Univ.) |
| (7) |
13:50-14:15 |
Thin EM Wave Absorber Design Using Metal Pattern Array Resonance |
Kohei Tsuyoshi, Shinichiro Yamamoto, Kenichi Hatakeyama (Univ. of Hyogo), Takanori Tsutaoka (Hiroshima Univ.) |
| |
14:15-14:30 |
Break ( 15 min. ) |
Fri, Nov 25 PM Regular
14:30 - 15:45 |
| (8) |
14:30-14:55 |
A Study of a Grounding Structure providing Radiated Noise Reduction |
Hiroaki Ikeda (JAE), Kohji Koshiji (TUS), Akihisa Sakurai (IBM Japan) |
| (9) |
14:55-15:20 |
Modeling and Prediction of Electromagnetic Immunity for Automotive Sensor Integrated Circuits |
Yuji Nishibe, Hideki Hosokawa (Toyota CRDL), Noriyuki Mase (DENSO CORP.), Oasami Wada (Kyoto Univ.) |
| (10) |
15:20-15:45 |
Correlation inspection between IC level EMI test and ECU level EMI test |
Mikiya Iida, Yukihisa Hasegawa, Kazuhisa Matsuge (Toshiba) |
| |
15:45-16:00 |
Break ( 15 min. ) |
Fri, Nov 25 PM Special Talk
16:00 - 16:55 |
| (11) |
16:00-16:50 |
[Special Talk]
High Speed/High Frequency Signal Transmission Lines and Rlated EMC Problems |
Hideyuki Oh-hashi (Mitsubishi Electric Co.) |
| |
16:50-16:55 |
Closing Address ( 5 min. ) |
