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Technical Committee on Dependable Computing (DC)
Chair: Satoshi Fukumoto (Tokyo Metropolitan Univ.) Vice Chair: Hiroshi Takahashi (Ehime Univ.)
Secretary: Haruhiko Kaneko (Tokyo Inst. of Tech.), Masayuki Arai (Nihon Univ.)
DATE:
Wed, Feb 27, 2019 09:00 - 16:50
PLACE:
Kikai-shinko Kaikan(3-5-8 Shiba-koen, Minato-ku, Tokyo, 105-0011 Japan. http://www.jspmi.or.jp/kaigishitsu/access.html)
TOPICS:
VLSI Design and Test, etc.
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Wed, Feb 27 AM (09:00 - 10:40)
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(1) 09:00 - 09:25
Note on Target Fault Selection for 2-Pattern Test Generation Considering Critical Area
Naoya Uchiyama, Masayuki Arai (Nihon Univ.)
(2) 09:25 - 09:50
Variational Autoencoder-Based Efficient Test Escape Detection
Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST)
(3) 09:50 - 10:15
A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ)
(4) 10:15 - 10:40
Analysis of the hotspot distribution in the LSI
Yudai Kawano, Kohei Miyase (Kyutech), Shyue-Kung Lu (NTUST), Xiaoqing Wen, Seiji Kajihara (Kyutech)
----- Break ( 15 min. ) -----
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Wed, Feb 27 AM (10:55 - 12:10)
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(5) 10:55 - 11:20
Efficient Challenge-Response Pairs Generation and Evaluation for PUF Circuit Using BIST Circuit During Manufacturing Test
Tomoki Mino, Shintani Michihiro, Michiko Inoue (NAIST)
(6) 11:20 - 11:45
A built-in self-diagnosis mechanism based on self-generation of expected signatures
Yushiro Hiramoto, Satoshi Ohtake (Oita Univ.), Hiroshi Takahashi (Ehime Univ.)
(7) 11:45 - 12:10
An Efficient Approach to Recycled FPGA Detection Using WID Variation Modeling
Foisal Ahmed, Michihiro Shintani, Michiko Inoue (NAIST)
----- Break ( 90 min. ) -----
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Wed, Feb 27 PM (13:40 - 14:55)
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(8) 13:40 - 14:05
State Assignment Method to Improve Transition Fault Coverage for Datapath
Masayoshi Yoshimura (Kyoto Sangyo Univ.), Yuki Takeuchi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.)
(9) 14:05 - 14:30
FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing
Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas)
(10) 14:30 - 14:55
A Compaction Method for Test Sensitization State in Controllers
Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.)
----- Break ( 15 min. ) -----
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Wed, Feb 27 PM (15:10 - 16:50)
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(11) 15:10 - 15:35
State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines
Yuki Maeda, Hideyuki Ichihara, Tsuyoshi Iwagaki, Tomoo Inoue (Hiroshima City Univ.)
(12) 15:35 - 16:00
Improvement of Flip-Flop Performance Considering the Influence of Power Supply Noise
Yuya Kinoshita, Yukiya Miura (Tokyo Metropolitan Univ.)
(13) 16:00 - 16:25
(See Japanese page.)
(14) 16:25 - 16:50
Reliability evaluation of the optical navigation electronics of HAYABUSA2
-- Onboard demonstration of a high reliability system with limited resources --
Hiroki Hihara (NECSpace/NEC), Junpei Sano (NECSpace), Tetsuya Masuda (NEC), Hisashi Otake, Tatsuaki Okada, Naoko Ogawa, Yuichi Tsuda (JAXA)
# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.
=== Technical Committee on Dependable Computing (DC) ===
# FUTURE SCHEDULE:
Sun, Mar 17, 2019 - Mon, Mar 18, 2019: Nishinoomote City Hall (Tanega-shima) [Mon, Jan 14], Topics: ETNET2019
Mon, May 13, 2019 - Tue, May 14, 2019: Institute of Industrial Science, University of Tokyo , Topics: LSI and System Workshop 2019
Last modified: 2018-12-22 10:02:58
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