Mon, Feb 15 AM
Chair: Masayoshi Yoshimura (Kyushu Univ.)
09:00 - 09:50 |
| (1) |
09:00-09:25 |
A Statistical Method of Small Iddq Variance Outlier Detection |
Yoshiyuki Nakamura, Masashi Tanaka (NEC Electronics) |
| (2) |
09:25-09:50 |
Test Pattern Re-Ordering for Thermal-Uniformity during Test |
Makoto Nakao, Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara (Nara Inst. of Sci and Tech.) |
| |
09:50-10:00 |
Break ( 10 min. ) |
Mon, Feb 15 AM
Chair: Kohei Miyase (Kyushu Institute of Technology)
10:00 - 10:50 |
| (3) |
10:00-10:25 |
Study on a Test Generation Method for Transition Faults Using Multi Cycle Capture Test |
Hiroshi Ogawa, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.), Koji Yamazaki (Meiji Univ.) |
| (4) |
10:25-10:50 |
Modeling resistive open faults and generating their tests |
Hiroshi Takahashi, Yoshinobu Higami, Yuta Shudo, Yuji Takamune, Yuzo Takamatsu (Ehime Univ.), Toshiyuki Tsutsumi, Koji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) |
| |
10:50-11:00 |
Break ( 10 min. ) |
Mon, Feb 15 AM
Chair: Michiko Inoue (Nara Institute of Science and Technology)
11:00 - 11:50 |
| (5) |
11:00-11:25 |
A Method of Reproducing Iuput/Ouput Error Trace on High-level Design for Hardware Debug Support |
Yeonbok Lee, Tasuku Nishihara, Takeshi Matsumoto (Univ. of Tokyo.), Masahiro Fujita (Univ. of Tokyo./JST) |
| (6) |
11:25-11:50 |
A binding method for testability based on resources sequential depth reduction |
Takaaki Cho, Toshinori Hosokawa (Nihon Univ.) |
| |
11:50-13:20 |
Lunch Break ( 90 min. ) |
Mon, Feb 15 PM
Chair: Tomo Inoue (Horoshima City Univ.)
13:20 - 15:00 |
| (7) |
13:20-13:45 |
Reduction of execution times and areas for delay measurement by subtraction |
Toru Tanabe, Hirohisa Minato, Kentaroh Katoh, Kazuteru Namba, Hideo Ito (Chiba Univ.) |
| (8) |
13:45-14:10 |
A Test Compaction Oriented Control Point Insertion Method for Transition Faults |
Yoshitaka Yumoto, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.) |
| (9) |
14:10-14:35 |
On Calculation of Delay Test Quality for Test Cubes and X-filling |
Shinji Oku, Seiji Kajihara, Yasuo Sato, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech./JTS) |
| (10) |
14:35-15:00 |
Seed Selection for High Quality Delay Fault Test in BIST |
Akira Taketani, Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara (Nara Inst. of Sci and Tech.) |
| |
15:00-15:15 |
Break ( 15 min. ) |
Mon, Feb 15 PM
Chair: Toshinori Hosokawa (Nihon Univ.)
15:15 - 16:30 |
| (11) |
15:15-15:40 |
A Study on Acceptable Faults in Digital Filters |
Takumi Miyaguchi, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) |
| (12) |
15:40-16:05 |
High Speed X-Fault Diagnosis with Partial X-Resolution |
Kohei Miyase (Kyushu Inst. of Tech.), Yusuke Nakamura (Panasonic Communications Software Co.,Ltd.), Yuta Yamato, Xiaoqing Wen, Seiji Kajihara (Kyushu Inst. of Tech.) |
| (13) |
16:05-16:30 |
Consideration of Open Faults Model Based on Digital Measurement of TEG Chip |
Toshiyuki Tsutsumi (Meiji Univ.), Yasuyuki Kariya, Koji Yamazaki (Meiji Univ), Masaki Hashizume, Hiroyuki Yotsuyanagi (Tokushima Univ), Hiroshi Takahashi, Yoshinobu Higami, Yuzo Takamatsu (Ehime Univ) |
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