Fri, Feb 19 PM 13:15 - 14:35 |
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13:15-13:20 |
Opening Address ( 5 min. ) |
(1) |
13:20-13:45 |
Investigation of Electrical Contacts on a Nanometer Scale using a Nano-manipulator in Scanning Electron Microscope |
Jun Toyoizumi, Masanori Onuma, Takaya Kondo, Kikuo Mori (yazaki), Tetsuo Shimizu, Sumiko Kawabata, Norimichi Watanabe (AIST) |
(2) |
13:45-14:10 |
Characterization of Contact Oil in Electrical Contacts by the Alternating Current Impedance Method |
Fumitaka Teraoka, Kazuo Iida (Mie Univ.), Shigeru Sawada, Atsushi Shimizu (AutoNetworks Tech.) |
(3) |
14:10-14:35 |
Dependence of time evolution of contact resistance at the closed electrical contacts (6) |
Keita Miyashige, Sekikawa Junya (Shizuoka Univ.) |
|
14:35-14:45 |
Break ( 10 min. ) |
Fri, Feb 19 PM 14:45 - 16:00 |
(4) |
14:45-15:10 |
Restriction on Moving of Break Arcs Magnetically Blown-out with a High Polymer Material |
Keisuke Kato, Junya Sekikawa (Shizuoka Univ.) |
(5) |
15:10-15:35 |
Study on microscopic deformation of connecting points for fiber-optic connectors (2) |
Sirou Aono, Katsuyoshi Sakaime, Daisuke Saegusa, Ryo Nagase (CIT) |
(6) |
15:35-16:00 |
Latest Trends of JIS Z8115 DependabilityTerminology amendment drafts
-- Focus on relevant terms of failure and fault -- |
Fumiaki Harada (FXAT), AKihiko Masuda (R7 Studio), Tateki NIsh (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental motor) |
|
16:00-16:05 |
Closeing Address ( 5 min. ) |