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=============================================== Technical Committee on Reliability (R) Chair: Naoto Kaio (Hiroshima Shudo Univ.) Vice Chair: Hitoshi Watanabe (Tokyo Univ. of Science) Secretary: Mitsuhiro Kimura (Hosei Univ.), Hiroyasu Mawatari (NTT) Assistant: Akira Asato (Fujitsu), Nobuyuki Tamura (National Defense Academy) DATE: Fri, May 13, 2011 13:30 - 17:40 PLACE: (Prof. Masaru Sanada) TOPICS: ---------------------------------------- Fri, May 13 PM (13:30 - 17:40) ---------------------------------------- (1) 13:30 - 14:10 [Invited Talk] The combinational or selective usage of the laser SQUID microscope, the laser terahertz emission microscope, and related simulations -- Non-electrical-contact fault localization in LSI chips -- Kiyoshi Nikawa (Osaka Univ.), Masatsugu Yamashita (RIKEN), Toru Matsumoto (HPK), Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae (Osaka Univ.) (2) 14:10 - 14:35 Observation of Vth Distribution of MONOS Flash Memory Using Scanning Nonlinear Dielectric Microscopy Koichiro Honda (Fujitsu Labs.), Yasuo Cho (Tohoku Univ.) (3) 14:35 - 15:00 Crystal structure analysis of Carbon Nanotube Forests by XRD Hiroshi Furuta (KUT) (4) 15:00 - 15:25 Bias-Temperature Instability in Zin Oxide Thin-Film Transistors Mamoru Furuta, Takahiro Hiramatsu, Tokiyoshi Matsuda, Takashi Hirao (Kochi Univ. of Tech.), Yudai Kamada, Shizuo Fujita (Kyoto Univ.) ----- Break ( 20 min. ) ----- (5) 15:45 - 16:25 [Invited Talk] Failure analysis method using a Laser excitation quasi-electrostatic field sensing technique Seigo Ito, Kiyoaki Takiguchi (Tokyo Univ.) (6) 16:25 - 16:50 Evaluation of defect-tolerance in the quantum-dot cellular automata PLA Katsuyoshi Miura, Takayuki Notsu, Koji Nakamae (Osaka Univ) (7) 16:50 - 17:15 Produce of Yield Analysis System at Semiconductor Manufacture Factory. Shingo Himeno (Toshiba Oita Operations) (8) 17:15 - 17:40 Candidate Fault Portions Detection using CMOS Transistor Operation Point Analysis Kazuaki Kishi, Masaru Sanada (KUT) # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, Jun 17, 2011: [Wed, Apr 13] Fri, Jul 29, 2011: [Thu, May 19] # SECRETARY: Kimura, Mitsuhiro (Hosei Univ.) TEL 042-387-6116 FAX 042-387-6126 E-mail:  m   i Last modified: 2011-03-24 13:53:25 |
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