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| Chair |
|
Akira Matsuzawa (Tokyo Inst. of Tech.) |
| Vice Chair |
|
Kunio Uchiyama (Hitachi) |
| Secretary |
|
Yoshiharu Aimoto (NECEL), Makoto Nagata (Kobe Univ.) |
| Assistant |
|
Minoru Fujishima (Univ. of Tokyo), Yoshio Hirose (Fujitsu Labs.) |
|
|
|
| Chair |
|
Kiichi Kamimura (Shinshu Univ.) |
| Vice Chair |
|
Kanji Yasui (Nagaoka Univ. of Tech.) |
| Secretary |
|
Seiji Toyoda (NTT), Hidehiko Shimizu (Niigata Univ.) |
| Assistant |
|
Yasushi Takemura (Yokohama National Univ.), Naoki Oba (NTT) |
|
| Conference Date |
Thu, Jan 17, 2008 09:15 - 16:35
Fri, Jan 18, 2008 09:40 - 16:35 |
| Topics |
|
| Conference Place |
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Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Thu, Jan 17 AM
09:15 - 16:35 |
| (1) |
09:15-09:40 |
Non-Contact 10% Efficient 36mW Power Delivery Using On-Chip Inductor in 0.18-um CMOS  CPM2007-128 ICD2007-139 |
Yuan Yuxiang, Yoichi Yoshida, Tadahiro Kuroda (keio Univ.) |
| (2) |
09:40-10:05 |
Integrated evaluation of on-chip power supply noise and off-chip electromagnetic noise on digital LSI CPM2007-129 ICD2007-140 |
Yuki Takahashi (Kobe Univ.), Kouji Ichikawa (Denso), Makoto Nagata (Kobe Univ.) |
| (3) |
10:05-10:30 |
ptimization of Active Substrate Noise Cancellng Technique Using Multi di/dt Detectors CPM2007-130 ICD2007-141 |
Toru Nakura, Taisuke Kazama, Makoto Ikeda, Kunihiro Asada (The Univ. of Tokyo) |
| |
10:30-10:45 |
Break ( 15 min. ) |
| (4) |
10:45-11:10 |
All Digital Gated Oscillator for Dynamic Supply Noise Measurement CPM2007-131 ICD2007-142 |
Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye (Osaka Univ.) |
| (5) |
11:10-11:35 |
Design of an On-Chip Noise Canceller with High Voltage Supply Lines for Nanosecond-Range Power Supply Noise CPM2007-132 ICD2007-143 |
Yasumi Nakamura, Makoto Takamiya, Takayasu Sakurai (Univ. of Tokyo) |
| (6) |
11:35-12:00 |
LSI and PCB Unified Noise Analysis CAD System CPM2007-133 ICD2007-144 |
Toshiro Sato, Hiroyuki Orihara, Shogo Fujimori, Masaki Tosaka (FATEC) |
| |
12:00-13:00 |
Break ( 60 min. ) |
| (7) |
13:00-13:40 |
[Special Invited Talk]
On-chip monitors and power-supply integrity CPM2007-134 ICD2007-145 |
Makoto Nagata (Kobe Univ.) |
| (8) |
13:40-14:20 |
[Special Invited Talk]
Techniques for power supply noise management in the SX supercomputers CPM2007-135 ICD2007-146 |
Jun Inasaka, Mikihiro Kajita (NEC Corp.) |
| |
14:20-14:30 |
Break ( 10 min. ) |
| (9) |
14:30-15:10 |
[Special Invited Talk]
In-situ measurement of supply-noise maps with millivolt accuracy and nanosecond-order time resolution CPM2007-136 ICD2007-147 |
Yusuke Kanno, Yuki Kondoh (HCRL), Takahiro Irita, Kenji Hirose, Ryo Mori, Yoshihiko Yasu (Renesas Technology, Corp.), Shigenobu Komatsu, Hiroyuki Mizuno (HCRL) |
| |
15:10-15:25 |
Break ( 15 min. ) |
| (10) |
15:25-16:35 |
|
Fri, Jan 18 AM
09:40 - 16:35 |
| (11) |
09:40-10:05 |
Arithmetic operation circuit based on abacus architecture CPM2007-137 ICD2007-148 |
Syunsuke Nagasawa, Shugang Wei (Gunma Univ) |
| (12) |
10:05-10:30 |
A compact RF signal quality measurement macro for RF test and diagnosis CPM2007-138 ICD2007-149 |
Koichi Nose, Masayuki Mizuno (NEC) |
| (13) |
10:30-10:55 |
A Method for Measuring Vref Noise Tolerance of DDR2-SDRAM on Test Board that Simulates Memory Module CPM2007-139 ICD2007-150 |
Yutaka Uematsu, Hideki Osaka (Hitachi), Yoji Nishio, Susumu Hatano (Elpida) |
| |
10:55-11:10 |
Break ( 15 min. ) |
| (14) |
11:10-12:00 |
[Tutorial Lecture]
Survey of Analysis Techniques for On-chip Power Distribution Networks CPM2007-140 ICD2007-151 |
Takashi Sato (Tokyo Tech.) |
| |
12:00-13:00 |
Lunch Break ( 60 min. ) |
| (15) |
13:00-13:25 |
Study on Low Stress Condition of Pseudo-SOC Integration Using Stress Analysis CPM2007-141 ICD2007-152 |
Yutaka Onozuka, Hiroshi Yamada, Atsuko Iida, Kazuhiko Itaya, Hideyuki Funaki (Toshiba R & D Center) |
| (16) |
13:25-13:50 |
An Extraction Method of Material Constants by Transmission Line Measurements CPM2007-142 ICD2007-153 |
Hiroshi Toyao, Yoshiaki Wakabayashi (NEC) |
| (17) |
13:50-14:15 |
A Package-on-Package using Coreless Substrate with Excellent Power Integrity CPM2007-143 ICD2007-154 |
Kentaro Mori, Jun Sakai, Katsumi Kikuchi, Shinji Watanabe, Tomoo Murakami, Shintaro Yamamichi (NEC) |
| (18) |
14:15-14:40 |
Assessment Test for Solder Joint Reliability in Mobile Products CPM2007-144 ICD2007-155 |
Masazumi Amagai, Hiroyuki Sano (TI Japan) |
| |
14:40-14:55 |
Break ( 15 min. ) |
| (19) |
14:55-15:20 |
Chip Thinning Technologies Realizing High Chip Strength CPM2007-145 ICD2007-156 |
Shinya Takyu, Tetsuya Kurosawa, Noriko Shimizu, Susumu Harada (Toshiba Co.) |
| (20) |
15:20-15:45 |
A multi-layer wafer-level 5-um-thick Cu wiring technology with photosensitive resin CPM2007-146 ICD2007-157 |
Katsumi Kikuchi (NEC), Kouji Soejima (NECEL), Yasuhiro Ishii (NEC), Masaya Kawano (NECEL), Masayuki Mizuno, Shintaro Yamamichi (NEC) |
| (21) |
15:45-16:10 |
A method of Ultra-fine Pad Interconnection using Electroless Deposition CPM2007-147 ICD2007-158 |
Tokihiko Yokoshima, Yasuhiro Yamaji, Yuichiro Tamura, Katsuya Kikuchi, Hiroshi Nakagawa, Masahiro Aoyagi (AIST) |
| (22) |
16:10-16:35 |
Reliability evaluation of lead free solder joint against vibration load under thermal circumstance CPM2007-148 ICD2007-159 |
Michiya Matsushima (Osaka Univ.), Toshiyuki Hamano (ESPEC), Kiyokazu Yasuda, Kozo Fujimoto (Osaka Univ.) |
| Contact Address and Latest Schedule Information |
| ICD |
Technical Committee on Integrated Circuits and Devices (ICD) [Latest Schedule]
|
| Contact Address |
Yoshiharu Aimoto (NEC Electronics Corporation)
TEL +81-44-435-1258, +81-44-435-1878
E- :     ai    cel |
| CPM |
Technical Committee on Component Parts and Materials (CPM) [Latest Schedule]
|
| Contact Address |
Hidehiko Shimizu（Niigata University）
TEL 025-262-6811, FAX 025-262-6811
E-:   eng i  -u
Yasushi Takemura（Yokohama National University）
TEL 045-339-4151, FAX 045-339-4151
E-:    y |
Last modified: 2008-01-04 12:13:48
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