Fri, Dec 13 PM 13:00 - 17:40 |
(1) |
13:00-13:25 |
Efficient Scan-Based BIST Architecture for Application-Dependent FPGA Test |
Keita Ito, Tomokazu Yoneda, Yuta Yamato, Kazumi Hatayama, Michiko Inoue (NAIST) |
(2) |
13:25-13:50 |
Variable Test-Timing Generation for Built-In Self-Test on FPGA |
Yasuo Sato, Munehiro Matsuura, Hitoshi Arakawa, Yousuke Miyake, Seiji Kajihara (Kyushu Inst. of Tech.) |
(3) |
13:50-14:15 |
Construction of High Quality Delay Test Set Using Fast On-Chip Delay Measurement |
Kentaroh Katoh (TNCT), Haruo Kobayashi (Gunma University) |
(4) |
14:15-14:40 |
Improved error correction method of PPM compression |
Kazuki Tokuda, Masato Kitakami (Chiba Univ.) |
(5) |
14:40-15:05 |
An Analysis of Optimal Node Assignment for the Data Replication Protocol with File Versioning |
Satoshi Fukumoto, Mamoru Ohara (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.) |
|
15:05-15:10 |
Break ( 5 min. ) |
(6) |
15:10-15:35 |
[Invited Talk]
Safety-related International Standards and Certification
-- Issues of RAMS Standard and Study of Solutions (1) -- |
Korefumi Tashiro (NTSEL) |
(7) |
15:35-16:00 |
On the effects of the interaction between power line and SCADA networks on system robustness |
Yuki Matsui, Hideharu Kojima, Tatsuhiro Tsuchiya (Osaka Univ.) |
(8) |
16:00-16:25 |
Development of Crack Detection System Using Image Composition |
Shinichi Tomiyama, Norihiro Ohira (TIRI) |
(9) |
16:25-16:50 |
Verification of High-Reliability Communication Method using the Data of Electromagnetic Environment |
Daisuke Koshino, Kazuaki Ishioka, Keijiro Take, Fumio Ishizu (Mitsubishi Electric) |
(10) |
16:50-17:15 |
Introduction effects of software prototyping on the stage of software requirements specification |
Tomoe Kuronuma, Sei Takahashi, Hideo Nakamura (Nihon Univ.), Takeo Ikeda, Masaya Mori, Satoshi Imamura (The Nippon Signal Co., Ltd.) |
(11) |
17:15-17:40 |
A Study on Dependable Location Detection Systems by applying an Inertial Sensor to a Variable Axel Load Vehicle |
Takashi Yamamichi, Takayasu Kitano, Koji Iwata (RTRI), Akira Asano (Kyosan Electric Manufacturing) |