===============================================
Technical Committee on Dependable Computing (DC)
Chair: Nobuyasu Kanekawa (Hitachi) Vice Chair: Michiko Inoue (NAIST)
Secretary: Koji Iwata (RTRI), Tatsuhiro Tsuthiya (Osaka Univ.)
DATE:
Fri, Feb 13, 2015 10:00 - 16:50
PLACE:
TOPICS:
VLSI Design and Test, etc
----------------------------------------
Fri, Feb 13 AM (10:00 - 11:15)
----------------------------------------
(1) 10:00 - 10:25
Studies on FPGA Rejuvenation
Aromhack Saysanasongkham, Satoshi Fukumoto (Tokyo Metropolitan Univ.)
(2) 10:25 - 10:50
Study on Reliability Improvements of MLC PCM by Threshold Modification
Shinya Nakano, Masayuki Arai (Nihon Uni.v)
(3) 10:50 - 11:15
Note on Evaluation of Dependable Design Based on Approximate Logic
Haruki Saito, Masayuki Arai (Nihon Uni.v)
----- Break ( 15 min. ) -----
----------------------------------------
Fri, Feb 13 AM (11:30 - 12:20)
----------------------------------------
(4) 11:30 - 11:55
A Hardware Trojan Circuit Detection Method Based on Information of Nontransitional Lines
Tomohiro Bouyashiki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (KUS)
(5) 11:55 - 12:20
Test Method for Encryption LSI against Scan-based Attacks
Masayoshi Yoshimura (Kyoto Sangyo Univ.), Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.)
----- Lunch Break ( 85 min. ) -----
----------------------------------------
Fri, Feb 13 PM (13:45 - 14:40)
----------------------------------------
(6) 13:45 - 14:40
Report of International Test Conference
ITC Asian Committee (ITC Asian Comm)
----- Break ( 15 min. ) -----
----------------------------------------
Fri, Feb 13 PM (14:55 - 15:45)
----------------------------------------
(7) 14:55 - 15:20
A Method of Scheduling in High-Level Synthesis for Hierarchical Testability
Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.)
(8) 15:20 - 15:45
A Method of LFSR Seed Generation for Hierarchical BIST
Kosuke Sawaki, Satoshi Ohtake (Oita Univ.)
----- Break ( 15 min. ) -----
----------------------------------------
Fri, Feb 13 PM (16:00 - 16:50)
----------------------------------------
(9) 16:00 - 16:25
An Evalution of a Fault Diagnosis Method for Single Logical Faults Using Multi Cycle Capture Test Sets
Hideyuki Takano, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.)
(10) 16:25 - 16:50
A Simulated Annealing based Low IR Drop Pattern Selection Method for Resistive Open Fault Diagnosis
Senling Wang, Taiga Inoue, Hanan T.al-awadhi, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.)
# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.
=== Technical Committee on Dependable Computing (DC) ===
# FUTURE SCHEDULE:
Fri, Mar 6, 2015 - Sat, Mar 7, 2015: [Tue, Jan 13]
Fri, Apr 17, 2015: [Tue, Feb 17]
Mon, May 11, 2015 - Wed, May 13, 2015: Kitakyushu International Conference Center , Topics: LSI and System Workshop 2015
Last modified: 2014-12-24 17:18:15
|
Notification: Mail addresses are partially hidden against SPAM.
|