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| Chair |
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Takashi Aikyo (STARC) |
| Vice Chair |
|
Tomohiro Yoneda (NII) |
| Secretary |
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Masato Kitagami (Chiba Univ.), Michinobu Nakao (Renesas) |
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| Conference Date |
Fri, Jun 19, 2009 10:20 - 16:00 |
| Topics |
Design, Test, Verification |
| Conference Place |
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Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Jun 19 AM Design, test and verification
Chair: Michinobu Nakao
10:20 - 12:00 |
| (1) |
10:20-10:45 |
Design method of easily testable parallel prefix adders  DC2009-10 |
Hidetoshi Suzuki, Naofumi Takagi (Nagoya Univ) |
| (2) |
10:45-11:10 |
Note on Yield and Area Trade-offs for MBIST in SoC DC2009-11 |
Masayuki Arai, Tatsuro Endo, Kazuhiko Iwasaki (Tokyo Metro. Univ.), Michinobu Nakao, Iwao Suzuki (Renesas Tech Corp.) |
| (3) |
11:10-11:35 |
A Test Generation Algorithm Based on 5-valued Logic for Threshold Testing DC2009-12 |
Nobukazu Izumi, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) |
| (4) |
11:35-12:00 |
Diagnositc Test Generation for Transition Faults Using a Stuck-at ATPG Tool DC2009-13 |
Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi (Ehime Univ.), Yoshihiro Simizu, Takashi Aikyo (STARC), Yuzo Takamatsu (Ehime Univ.) |
| |
12:00-13:30 |
Break ( 90 min. ) |
Fri, Jun 19 PM Invited Talk
Chair: Tomoo Inoue
13:30 - 14:30 |
| (5) |
13:30-14:30 |
[Invited Talk]
High-level Design for Test Tools & Industrial Design Flows DC2009-14 |
Chouki Aktouf (DeFacTo) |
| |
14:30-14:45 |
Break ( 15 min. ) |
Fri, Jun 19 PM Industrial Session
Chair: Shuji Hamada
14:45 - 16:00 |
| (6) |
14:45-15:10 |
Power & Noise Aware Test Utilizing Preliminary Estimation DC2009-15 |
Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo (STARC) |
| (7) |
15:10-15:35 |
* DC2009-16 |
Koichiro Noguchi, Koichi Nose (NEC Corp.), Toshinobu Ono (NEC Electronics Corp.), Masayuki Mizuno (NEC Corp.) |
| (8) |
15:35-16:00 |
Case study: Fault diagnosis for detecting systematic fault DC2009-17 |
Hiroshi Yamamoto, Hiroki Wada, Toru Ogushi, Michinobu Nakao (Renesas Tech. Corp.) |
| Announcement for Speakers |
| General Talk | Each speech will have 25 minutes for presentation and 5 minutes for discussion. |
| Invited Talk | Each speech will have 55 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| DC |
Technical Committee on Dependable Computing (DC) [Latest Schedule]
|
| Contact Address |
|
Last modified: 2009-04-20 21:30:48
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