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=============================================== Technical Committee on Reliability (R) Chair: Naoto Kaio (Hiroshima Shudo Univ.) Vice Chair: Hitoshi Watanabe (Tokyo Univ. of Science) Secretary: Mitsuhiro Kimura (Hosei Univ.), Hiroyasu Mawatari (NTT) Assistant: Akira Asato (Fujitsu), Nobuyuki Tamura (National Defense Academy) DATE: Fri, Nov 19, 2010 14:00 - 16:15 PLACE: TOPICS: ---------------------------------------- Fri, Nov 19 PM (14:00 - 16:15) ---------------------------------------- (1) 14:00 - 14:25 Evaluation of degradation at a solder connected point due to electromigration Akihiro Higuchi, Kazunori Hiraoka (Salesian Poly.) (2) 14:25 - 14:50 Performance Degradation of Photovoltaic Modules with Rapid Thermal-Cycling Yuichi Aoki, Manabu Okamoto (Espec Corp.), Atsushi Masuda, Takuya Doi (AIST) (3) 14:50 - 15:15 The improvement of the sealing reliability of relays by the means of reducing permeability in sealing adhesives Tomohiro Fukuhara, Mitsuo Ito, Osamu Otani (OMRON) ----- Break ( 10 min. ) ----- (4) 15:25 - 15:50 A Bootstrap Software Reliability Assessment Method in the Final Stage of Software Testing Process Takaji Fujiwara (Biz3), Mitsuhiro Kimura (Hosei Univ.) (5) 15:50 - 16:15 Inference of Reliability for Degradation Data Based on Stochastic Process Models Toru Kaise (Univ. of Hyogo) # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is in cooperation with Reliability Engineering Association of Japan. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, Dec 17, 2010: [Thu, Oct 21] Fri, Feb 18, 2011: Shizuoka Univ. (Hamamatsu) [Tue, Dec 14] # SECRETARY: Kimura, Mitsuhiro (Hosei Univ.) TEL 042-387-6116 FAX 042-387-6126 E-mail:  m   i Last modified: 2010-09-24 15:51:19 |
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