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Technical Committee on Reliability (R)
Chair: Tetsushi Yuge (National Defense Academy) Vice Chair: Akira Asato (Fujitsu)
Secretary: Nobuyuki Tamura (Hosei Univ.), Shigeto Hiraguri (RTRI)
Assistant: Shinji Inoue (Kansai Univ.), Hiroyuki Okamura (Hiroshima Univ.)
DATE:
Thu, Nov 15, 2018 14:00 - 16:20
PLACE:
TOPICS:
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Thu, Nov 15 PM (14:00 - 16:20)
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(1) 14:00 - 14:25
A Study for Accelerated Humidity Stress Test (Part 2)
Sadanori Ito (itoken)
(2) 14:25 - 14:50
The study of Acceleration model Based on the Step Stress test (2)
Toshinari Matsuoka (MELCO)
----- Break ( 15 min. ) -----
(3) 15:05 - 15:30
Reliability Analysis Based on Hierarchical Bayesian Models Using Deep Learning Methods
Toru Kaise (Univ. of Hyogo)
(4) 15:30 - 15:55
A Study of Bayesian Statistical Analysis for Failure Number Data
Toru Kaise (Uni. of Hyogo)
(5) 15:55 - 16:20
Some topics on common-cause failure analysis
Tetsushi Yuge (NDA)
# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.
# CONFERENCE SPONSORS:
- This conference is co-sponsored by Kansai Branch of Reliability Engineering Association of Japan, IEEE Reliability Society Japan Chapter.
=== Technical Committee on Reliability (R) ===
# FUTURE SCHEDULE:
Sat, Dec 15, 2018: [Mon, Oct 15]
Fri, Feb 15, 2019: [Thu, Dec 20]
# SECRETARY:
Hiroyuki Okamura (Hiroshima Univ.)
E-mail: -u
Last modified: 2018-09-21 15:22:03
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