|
|
| Chair |
|
Kiyoshi Yoshida (Nippon Inst. of Tech.) |
| Vice Chair |
|
Makoto Hasegawa (Chitose Inst. of Science and Tech.) |
| Secretary |
|
Junya Sekikawa (Shizuoka Univ.), Nobuhiro Kuga (Yokohama National Univ.) |
| Assistant |
|
Yasuhiro Hattori (Sumitomo Denso) |
|
| Conference Date |
Fri, Jan 28, 2011 13:00 - 16:30 |
| Topics |
Electromechanical Devices |
| Conference Place |
Japan Aviation Electronics Industry,Limited |
| Address |
1-1, Musashino 3-chome, Akishima-shi, Tokyo 196-8555, Japan |
| Transportation Guide |
http://www.jae.co.jp/intro/mp_akisima.html |
Fri, Jan 28 PM
13:00 - 16:30 |
| (1) |
13:00-13:25 |
A Discussion on Carbon Arc V-I Characteristics |
Keiichi Suhara (TNCT) |
| (2) |
13:25-13:50 |
Three-Dimensional Micro-Structural Study of Tin Plated Fretting Contacts |
Tetsuya Ito, Shigeru Ogihara, Yasuhiro Hattori (ANT) |
| (3) |
13:50-14:15 |
Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts |
Soushi Masui, Shigeru Sawada, Terutaka Tamai (Mie Univ), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ) |
| (4) |
14:15-14:40 |
Fretting characteristics about the shape and weight of tin-plated contacts |
Tomishige Tai, Tetsuya Komoto (JAE) |
| |
14:40-14:50 |
Break ( 10 min. ) |
| (5) |
14:50-15:15 |
Design of Optical Rotary Link Joint Using Coaxial Multi-core Plastic Optical Fiber |
Kazuya Kaba, Makoto Kawashima (Chubu Univ), Shunsuke Kawabata (Ihara Electronic), Seiji Sashou (Asahi Kasei E-materials) |
| (6) |
15:15-15:40 |
Effects of resin-clay nanocomposites on the ionic migration inhibitors in Ag-printed circuits |
Yasuyuki Ohtani, Shin-ichiro Nakajima (JAE) |
| (7) |
15:40-16:05 |
Degradation phenomenon of electrical contacts by a tapping device
-- A tapping device for trial (1) -- |
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Daiki Ishizuka, Kunio Yanagi, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) |
| (8) |
16:05-16:30 |
Degradation phenomenon of electrical contacts by a tapping device
-- A tapping device for trial (2) -- |
Keiji Koshida, Shin-ichi Wada, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| EMD |
Technical Committee on Electromechanical Devices (EMD) [Latest Schedule]
|
| Contact Address |
Makoto Hasegawa（Chitose Inst. of Science and Technorogy）
TEL (0123)27-6059、FAX (0123)27-6059
E- :      p  n  
Junya Sekikawa (Shizuoka Univ.)
TEL (053) 478-1618、FAX (053) 478-1618
E-: tj kipc  
Yasuhiro Hattori（Sumitomo Wiring Systems, Ltd.)
TEL (059)382-8970、FAX (059)382-8591
E-:     -t  sws |
| Announcement |
Latest information will be presented on the homepage:
http://www.ieice.org/es/emd/jpn/ |
Last modified: 2011-01-25 18:31:18
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