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=============================================== Technical Committee on Electromechanical Devices (EMD) Chair: Kiyoshi Yoshida (Nippon Inst. of Tech.) Vice Chair: Makoto Hasegawa (Chitose Inst. of Science and Tech.) Secretary: Junya Sekikawa (Shizuoka Univ.), Nobuhiro Kuga (Yokohama National Univ.) Assistant: Yasuhiro Hattori (Sumitomo Denso) DATE: Fri, Jan 28, 2011 13:00 - 16:30 PLACE: Japan Aviation Electronics Industry,Limited(1-1, Musashino 3-chome, Akishima-shi, Tokyo 196-8555, Japan. http://www.jae.co.jp/intro/mp_akisima.html) TOPICS: Electromechanical Devices ---------------------------------------- Fri, Jan 28 PM (13:00 - 16:30) ---------------------------------------- (1) 13:00 - 13:25 A Discussion on Carbon Arc V-I Characteristics Keiichi Suhara (TNCT) (2) 13:25 - 13:50 Three-Dimensional Micro-Structural Study of Tin Plated Fretting Contacts Tetsuya Ito, Shigeru Ogihara, Yasuhiro Hattori (ANT) (3) 13:50 - 14:15 Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts Soushi Masui, Shigeru Sawada, Terutaka Tamai (Mie Univ), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ) (4) 14:15 - 14:40 Fretting characteristics about the shape and weight of tin-plated contacts Tomishige Tai, Tetsuya Komoto (JAE) ----- Break ( 10 min. ) ----- (5) 14:50 - 15:15 Design of Optical Rotary Link Joint Using Coaxial Multi-core Plastic Optical Fiber Kazuya Kaba, Makoto Kawashima (Chubu Univ), Shunsuke Kawabata (Ihara Electronic), Seiji Sashou (Asahi Kasei E-materials) (6) 15:15 - 15:40 Effects of resin-clay nanocomposites on the ionic migration inhibitors in Ag-printed circuits Yasuyuki Ohtani, Shin-ichiro Nakajima (JAE) (7) 15:40 - 16:05 Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (1) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Daiki Ishizuka, Kunio Yanagi, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) (8) 16:05 - 16:30 Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (2) -- Keiji Koshida, Shin-ichi Wada, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. === Technical Committee on Electromechanical Devices (EMD) === # FUTURE SCHEDULE: Fri, Feb 18, 2011: Shizuoka Univ. (Hamamatsu) [Tue, Dec 14] Fri, Mar 4, 2011: Nippon Institute of Technology [Mon, Jan 17] Apr, 2011: Recess # SECRETARY: Makoto Hasegawa（Chitose Inst. of Science and Technorogy） TEL (0123)27-6059、FAX (0123)27-6059 E-mail:      p  n   Junya Sekikawa (Shizuoka Univ.) TEL (053) 478-1618、FAX (053) 478-1618 E-mail: tj  kipc   Yasuhiro Hattori（Sumitomo Wiring Systems, Ltd.) TEL (059)382-8970、FAX (059)382-8591 E-mail:     -t  sws # ANNOUNCEMENT: # Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/ Last modified: 2011-01-25 18:31:18 |
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