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=============================================== Technical Committee on Electromechanical Devices (EMD) Chair: Kiyoshi Yoshida (Nippon Inst. of Tech.) Vice Chair: Makoto Hasegawa (Chitose Inst. of Science and Tech.), Junya Sekikawa (Shizuoka Univ.) Secretary: Nobuhiro Kuga (Yokohama National Univ.), Yasuhiro Hattori (Sumitomo Denso) Assistant: Yoshiteru Abe (NTT) =============================================== Technical Committee on Reliability (R) Chair: Hitoshi Watanabe (Tokyo Univ. of Science) Vice Chair: Mitsuhiro Kimura (Hosei Univ.) Secretary: Hiroyasu Mawatari (NTT), Nobuyuki Tamura (National Defense Academy) Assistant: Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.), Maratt Zanikef (Tokyo Univ. of Science) DATE: Fri, Feb 17, 2012 10:30 - 16:00 PLACE: TOPICS: ---------------------------------------- Fri, Feb 17 AM (10:30 - 16:00) ---------------------------------------- ----- Opening Remark ( 5 min. ) ----- (1) 10:35 - 11:00 The improvement of the sealing reliability of relays which use polycarbonate for the case Yosuke Tatsuno, Osamu Otani, Tomohiro Fukuhara (OMRON) (2) 11:00 - 11:25 An experimental study on contact resistance characteristics of relay contacts operated in the vicinity of a new acryl-based polymer Makoto Hasegawa, Nanae Kobayashi (Chitose Inst. of Science and Technology), Yoshiyuki Kohno, Hiroshi Ando (Kaneka Corp.) (3) 11:25 - 11:50 An experimental study on an optical measurement system for damages on contact surfaces Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Science and Technology) ----- Break ( 60 min. ) ----- (4) 12:50 - 13:15 Influence of Final treatment on the Sticking figure of Silicon Cantilever-beam Ichiroh Katoh, Maya Kato (JAXA) (5) 13:15 - 13:40 Reliability evaluation of medium wave antenna auto-matching control system Kazuaki Wakai (DIT) (6) 13:40 - 14:05 A Study of Electric Resistances between Rail and Wheel Mitsuyoshi Fukuda, Takumi Ban, Eiichi Maebashi, Natsuki Terada, Hiroyuki Fujita, Takashi Toyama, Kosuke Owada, Yoshitaka Hatada (RTRI) (7) 14:05 - 14:30 A Study for lath-like Compound growth factor in Sn-Ni metalic plate(2) Sadanori Ito (itoken), Masafumi Suzuki (omron), Tomio Taniguchi (UP) ----- Break ( 10 min. ) ----- (8) 14:40 - 15:05 Effect of Contact Sliding on Contact Resistance Characteristics Syougo Sasayama (Mie Univ.), Yasushi Saitoh (ANtech), Terutaka Tamai (ELtech), Kazuo Iida (Mie Univ.), Yasuhiro Hattori (ANtech) (9) 15:05 - 15:30 Effect of Intermittent Time on Fretting Corrosion of Tin Plated Coupon Jumpei Yasuda, Kazuo Iida (Mie Univ.), Yasushi Saitoh (ANTech), Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (ANTech) (10) 15:30 - 15:55 Relationship between Electrical Contact Shapes and Electrical Endurance Fuminori Takeuchi, Koji Takami, Tetsuya Mori (OMRON) ----- Closing Remark ( 5 min. ) ----- # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan. === Technical Committee on Electromechanical Devices (EMD) === # FUTURE SCHEDULE: Fri, Mar 2, 2012: Tanagawa Univ. [Mon, Jan 16] Apr, 2012: Recess Fri, May 25, 2012: Tohoku Bunka Gakuen Univ. [Fri, Mar 16] # SECRETARY: Makoto Hasegawa（Chitose Inst. of Science and Technorogy） TEL (0123)27-6059、FAX (0123)27-6059 E-mail:      p  n   Junya Sekikawa (Shizuoka Univ.) TEL (053) 478-1618、FAX (053) 478-1618 E-mail: tj  kipc   Yasuhiro Hattori（Sumitomo Wiring Systems, Ltd.) TEL (059)382-8970、FAX (059)382-8591 E-mail:     -t  sws # ANNOUNCEMENT: # Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/ === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, May 25, 2012: [Wed, Mar 14], Topics: Softwar Reliability, etc. # SECRETARY: Kimura, Mitsuhiro (Hosei Univ.) TEL 042-387-6116 FAX 042-387-6126 E-mail: miLast modified: 2011-12-14 17:15:12 |
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