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=============================================== Technical Committee on Reliability (R) Chair: Mitsuhiro Kimura (Hosei Univ.) Vice Chair: Hiroyasu Mawatari (NTT) Secretary: Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.) Assistant: Nobuyuki Tamura (Hosei Univ.), Maratt Zanikef (Kyushu Inst. of Tech.) DATE: Thu, Nov 14, 2013 14:00 - 16:30 PLACE: TOPICS: ---------------------------------------- Thu, Nov 14 PM (14:00 - 16:30) ---------------------------------------- (1) 14:00 - 14:25 Newest non-destructive X-ray inspection technology of conducting research and development and failure analysis -- It introduces from the foundation to application. -- Masahito Natsuhara (shimadzu) (2) 14:25 - 14:50 Effective non-destructive defect localization by using Enhanced Lock-In Thermography Toshinobu Nagatomo (DCG Systems) (3) 14:50 - 15:15 Effect of Plate-Shape Ni-Sn IMC on the Growth Mechanism of Tin Whisker under Thermal Shock Stress Akira Saito, Akira Okamoto, Yoshihiro Iwahori, Makoto Ogawa (Mutrata MFG), Akihiro Motoki (Sabae Mutrata MFG) (4) 15:15 - 15:40 A Study on Sn-whisker growth by thermal cycle Sadanori Itou (Itoken office) (5) 15:40 - 16:05 Bayesian Reliability Analysis for Software Debugging Processes Based on Remaining Errors Toru Kaise (Univ. of Hyogo) (6) 16:05 - 16:30 Issues and Perspectives of Dependable LSI Design Koichiro Takayama, Akira Asato (Fujitsu) # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, Dec 13, 2013: [Wed, Oct 16] Fri, Feb 21, 2014: [Thu, Dec 12] # SECRETARY: Akira Asato (FUJITSU) E-mail: a          Last modified: 2013-09-25 15:02:06 |
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