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=============================================== Technical Committee on Reliability (R) Chair: Mitsuhiro Kimura (Hosei Univ.) Vice Chair: Hiroyasu Mawatari (NTT) Secretary: Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.) Assistant: Maratt Zanikef (Kyushu Inst. of Tech.), Nobuyuki Tamura (Hosei Univ.) DATE: Thu, Nov 20, 2014 13:45 - 16:25 PLACE: TOPICS: ---------------------------------------- Thu, Nov 20 PM (13:45 - 16:25) ---------------------------------------- (1) 13:45 - 14:10 Prediction of performance degradation and lifetime for semiconductor devices using markov chain model Kai Momoda, Koichi Endo, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae (Osaka Univ.) (2) 14:10 - 14:35 Reliability Analysis for Degradation Process Data Based on Bayesian Methods Toru Kaise (Univ. of Hyogo) (3) 14:35 - 15:00 Reliability Analysis for Degradation Processes Based on Stochastic Differential Equations Toru Kaise (Univ. of Hyogo) ----- Break ( 10 min. ) ----- (4) 15:10 - 15:35 The study about acceleration model of ceramic capacitors by voltage stress Toshinari Matsuoka (MELCO) (5) 15:35 - 16:00 Problem of Repeatability about Dew Test and Evaluation Method by Micro Dew Condensation Test Mayuko Nishihara, Kazuhiro Hayashinuma (Murata.Co) (6) 16:00 - 16:25 A Study on Evaluation for fretting corrosion Sadanori Itou (itoken office) # Information for speakers General Talk will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-hosted by IEEE Reliability Society Japan Chapter and Reliability Engineering Association of Japan (Kansai Chapter). === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, Dec 19, 2014: [Fri, Oct 17] Fri, Feb 20, 2015: [Fri, Dec 12] # SECRETARY: Akira Asato (FUJITSU) E-mail: a          Last modified: 2014-09-21 22:12:51 |
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