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Technical Committee on Reliability (R)
Chair: Naoto Kaio (Hiroshima Shudo Univ.) Vice Chair: Yasunori Kimura (Fujitsu Labs.)
Secretary: Mitsuhiro Kimura (Hosei Univ.), Hiroyasu Mawatari (NTT)
Assistant: Akira Asato (Fujitsu), Nobuyuki Tamura (National Defense Academy)
DATE:
Fri, Jun 19, 2009 13:00 - 15:20
PLACE:
TOPICS:
System Reliability, etc.
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Fri, Jun 19 PM (13:00 - 15:20)
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(1) 13:00 - 13:25
Observations and analyses on device structures for reliability of IC/LSI
Tsuneo Ajioka, Sumihisa Ishikawa, Keiichi Yamada (Toray Reaserch Center)
(2) 13:25 - 13:50
Consideration of short-term test method for Aluminum Electrolytic Capacitor
Kazuya Murakami, Kenji Adachi (Toshiba Corp.)
(3) 13:50 - 14:15
Investigation of latest failure analysis using by X-ray analyzer
Yoshiyuki Ihara, Yoshikazu Kobayashi (Kusumoto)
----- Break ( 15 min. ) -----
(4) 14:30 - 14:55
Faulure Analysis of connector for Power Supply
-- The example of Galvani corrosion due to deficiency of plating thickness --
Koji Hisanaga (NEC Infrontia Corp.)
(5) 14:55 - 15:20
A study on Non-parametric Estimation of Software Reliability
Shintaro Mizoguchi, Tadashi Dohi (Hiroshima Univ.)
# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.
=== Technical Committee on Reliability (R) ===
# FUTURE SCHEDULE:
Fri, Jul 31, 2009: [Mon, May 18]
# SECRETARY:
KIMURA, Mitsuhiro (Hosei Univ.)
TEL +81-42-387-6116
FAX +81-42-387-6126
E-mail: mi
Last modified: 2009-06-17 10:31:30
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