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Technical Committee on Reliability (R) [schedule] [select]
Chair Hitoshi Watanabe (Tokyo Univ. of Science)
Vice Chair Mitsuhiro Kimura (Hosei Univ.)
Secretary Hiroyasu Mawatari (NTT), Nobuyuki Tamura (Hosei Univ.)
Assistant Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.), Maratt Zanikef (Tokyo Univ. of Science)

Conference Date Thu, Nov 15, 2012 14:00 - 17:30
Topics  
Conference Place  
Sponsors This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan.

Thu, Nov 15 PM 
14:00 - 17:30
(1) 14:00-14:25 Software Reliability Prediction by Neural Network with Software Development Data Ryohei Shimada, Mitsuhiro Kimura (Hosei Univ.)
(2) 14:25-14:50 Software Reliability Analysis Based on Hierarchical Bayesian Weibull Models and Computational Inferences Using Common Knowledge Opinions Toru Kaise (Univ. of Hyogo)
(3) 14:50-15:15 The screening method for insulation degradation of printed wiring boards Hiroshi Kurokawa (Ryouden Kasei), Toshinari Matsuoka (Melco), Wataru Yagi (MCR)
(4) 15:15-15:40 A study of cracking mechanism by humidity and acceleration factor of PCT for MEMS thin film. Etsuko Matsui, Taichi Nakao, Junichi Shintani (OMRON Co.)
  15:40-15:50 Break ( 10 min. )
(5) 15:50-16:15 A study on ignition and spreading fire of PWB by ceramic chip capacitors Kojiro Iwatani, Kentaro Yanai, Satomi Manabe (Omron)
(6) 16:15-16:40 The safety and evaluation test of Lithium-Ion Secondary Battery Manabu Okamoto, Hideki Kawai, Arata Okuyama, Yuichi Aoki (Espec Corp.)
(7) 16:40-17:05 * Yutaka Ikemoto, Yasuyuki Komatsu (Qualtec)
(8) 17:05-17:30 A Studay on Evaluation for PWB Sadanori Ito (itoken)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Tamura, Nobuyuki (Hosei Univ.)
TEL 042-387-6262
FAX 042-387-6126
E--mail: i 


Last modified: 2012-09-21 09:59:47


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