Online edition: ISSN 2432-6380
[TOP] | [2016] | [2017] | [2018] | [2019] | [2020] | [2021] | [2022] | [Japanese] / [English]
DC2019-78
Consideration of AHP calculation method according to scale
Ryota Kouduki, Naohiro Morishima, Yukiko Sugimoto, Tomoki Kobayashi (Kyosan), Takeshi Mizuma, Upvinder Singh, Maheshuni Shiva Krishna (UTokyo)
pp. 1 - 6
DC2019-79
Consideration of safety analysis application in railway signal system
-- Safety analysis using FMEA, STAMP and HAZOP --
Tomoki Kobayashi, Yukiko Sugimoto, Ryota Kouduki, Naohiro Morishima (Kyosan), Upvinder Singh, Maheshuni Shiva Krishna, Takeshi Mizuma (UTokyo)
pp. 7 - 10
DC2019-80
STAMP & FTA
-- Proposal of New Safety Evaluation Method using STAMP & FTA --
Upvinder Singh, Takeshi Mizuma (UTokyo), Hideo Nakamura (NU), Yukiko Sugimoto (Kyosan)
pp. 11 - 15
DC2019-81
Examination of safety evaluation method of railway signal system
-- Combined use of FMEA, FTA and STPA --
Yukiko Sugimoto, Tomoki Kobayashi, Ryota Kouzuki, Naohiro Morishima (Kyosan), Takeshi Mizuma, Upvinder Singh, Maheshuni Shiva Krishna (Univ. of Tokyo)
pp. 17 - 20
DC2019-82
Classification of railway stop positions by machine learning using on-board equipment accumulated data
Naohiro Morishima, Ryota kouduki, Tomoki Kobayashi, Yukiko Sugimoto (Kyosan), Takeshi Mizuma, Upvinder Singh Upvinder, Shiva Krishna Maheshuni (The University of Tokyo)
pp. 21 - 23
DC2019-83
Study on Condition-Based Maintenance of Railway Signal Equipment using the Machine Learning
Hiroshi Shida (JR West), Akihiro Tamura, Takashi Ninomiya, Hiroshi Takahashi (Ehime Univ)
pp. 25 - 30
DC2019-84
Extension of an Approximate Voting Scheme IDMR for Fail-Operational Systems
Kazunori Yukihiro, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.)
pp. 31 - 36
DC2019-85
Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test
Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU)
pp. 37 - 42
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.