Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2016] | [2017] | [2018] | [2019] | [2020] | [2021] | [2022] | [Japanese] / [English]
DC2019-53
Takuya Kojima, Hideharu Amano (Keio Univ.)
pp. 1 - 6
DC2019-54
Gate Level Netlist Function Classification Method Based on R-GCN
Yuichiro Fujishiro, Hiroki Oyama, Motoki Amagasaki, Masahiro Iida (Kumamoto Univ.), Hiroaki Yasuda, Hiroto Ito (MITSUBISHI ELECTRIC ENGINEERING)
pp. 7 - 12
DC2019-55
(See Japanese page.)
pp. 13 - 18
DC2019-56
A New ATPG-based Logic Optimization Method by Removing the Redundant Multiple Faults
Peikun Wang, Amir Masaud Gharehbaghi, Masahiro Fujita (The Univ. of Tokyo)
pp. 19 - 22
DC2019-57
On-Chip Leakage Monitor based Temperature Sensor Circuit for Ultra Low Voltage
Daisuke Sato, Kimiyoshi Usami (SIT)
pp. 45 - 50
DC2019-58
Design of Reference-free CMOS Temperature Sensor with Statistical MOSFET Selection
Shogo Harada, Mahfuzul Islam, Takashi Hisakado, Osami Wada (Kyoto Univ.)
pp. 51 - 56
DC2019-59
NBTI Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement
Takumi Hosaka (Saitama Univ.), Shinichi Nishizawa (Fukuoka Univ.), RYO Kishida (Tokyo Univ. of Science), Takashi Matsumoto (The Univ. of Tokyo), Kazutoshi Kobayashi (Kyoto Institute of Tech.)
pp. 57 - 62
DC2019-60
Device characteristic measurement for realizing CMOS-compatible non-volatile memory using FiCC
Ippei Tanaka, Naoyuki Miyagawa, Tomoya Kimura, Takashi Imagawa, Hiroyuki Ochi (Ritsumeikan Univ.)
pp. 63 - 68
DC2019-61
*
Ryota Ishikawa, Masashi Tawada, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.)
pp. 69 - 74
DC2019-62
(See Japanese page.)
pp. 93 - 94
DC2019-63
[Keynote Address]
Prospect for Knowledge Intensive Society leveraged by VLSI Design
Hiroshi Nakamura (UTokyo)
p. 95
DC2019-64
Solving Traveling Salesman Problem Using Grid Partitioning via Ising-Model based Solver
Akira Dan, Takeshi Nishikawa, Takashi Sato (Kyoto Univ.)
pp. 97 - 102
DC2019-65
(See Japanese page.)
pp. 103 - 108
DC2019-66
High-Radix CORDIC algorithm for calculating arc-sine and arc-cosine
Hiroshi Matsuoka, Naofumi Takagi (Kyoto Univ.)
pp. 109 - 113
DC2019-67
A Generation Method of Easily Testable Functional k Time Expansion Model for a Transition Fault Model Using Controller Augmentation and Partial Scan Designs
Yuta Ishiyama, Toshinori Hosokawa, Yuki Ikegaya (Nihon Univ.)
pp. 133 - 138
DC2019-68
Compacted Seed Generation for Built-in Self-Diagnosis of Delay Faults
Yuta Nakano, Satoshi Ohtake (Oita Univ.)
pp. 139 - 143
DC2019-69
Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method
Norihiro Nakaoka, Tomoki Aono, Sohshi Kudoh, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas)
pp. 145 - 150
DC2019-70
Test Generation for Hardware Trojan Detection Using the Delay Difference of a Pair of Independent Paths
Suguru Rikino, Yushiro Hiramoto, Satoshi Ohtake (Oita Univ.)
pp. 151 - 155
DC2019-71
[Keynote Address]
Co-optimization of hardware architecture and algorithm for energy-efficient CNN inference
Daisuke Miyashita (Kioxia)
p. 173
DC2019-72
[Keynote Address]
Technology Trends of Persistent Memory
Satoshi Imamura (FLL)
p. 175
DC2019-73
[Invited Talk]
Optimization Problems in Quantum Circuit Design
Shigeru Yamashita (Ritsumeikan Univ.)
p. 177
DC2019-74
A Method of Parallel Computing for Detailed Routing on Ample Areas
Yuya Shijo, Kunihiro Fujiyoshi (TUAT)
pp. 179 - 184
DC2019-75
Lithography Hotspot Detection Based on Feature Vectors Considering Wire Width and Distance
Gaku Kataoka, Masato Inagi, Shinobu Nagayama, Shin'ichi Wakabayashi (Hiroshima City Univ.)
pp. 185 - 190
DC2019-76
Analysis of databases used for hot spot test cases
Hiroki Ogura, Hidekazu Takahashi, Sinpei Sato, Atsushi Takahashi (Tokyo Tech)
pp. 191 - 196
DC2019-77
Mask Optimization Considering Process Variation by Subgradient Method
Yukihide Kohira, Rina Azuma (Univ. of Aizu), Tomomi Matsui, Atsushi Takahashi (Tokyo Tech), Chikaaki Kodama (KIOXIA)
pp. 197 - 202
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.