Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2013] | [2014] | [2015] | [2016] | [2017] | [2018] | [2019] | [Japanese] / [English]
DC2016-20
ZDD-based test case generation method for high strength combinatorial interaction testing
Teru Ohashi, Tatsuhiro Tsuchiya (Osaka Univ)
pp. 1 - 6
DC2016-21
Model Checking of Fault Tolerant Systems Using Abstract Timestamps
Shinya Nakano, Tatsuhiro Tsuchiya (Osaka Univ.)
pp. 7 - 11
DC2016-22
Faster Wait-free Randomized Consensus with an Oblivious Adversary for MRSW Register Model
Sen Moriya (Kindai Univ.), Michiko Inoue (NAIST)
pp. 13 - 18
DC2016-23
Error Correction Method for Interblock Burst Error of PPM Compression
Takuya Muroi, Masato Kitakami (Chiba Univ.)
pp. 19 - 24
DC2016-24
Single Limited-Magnitude Error Correcting Codes Using Integer Residue Ring of Large Order
Shohei Kotaki, Masato Kitakami (Chiba Univ.)
pp. 25 - 29
DC2016-25
Note on Data Aggregation on Smart Grid Communications Considering Fault Tolerance and Privacy
Ryota Ogasawara, Masayuki Arai (Nihon Univ.)
pp. 31 - 36
DC2016-26
Model Based Test Case Generation for Web Application Using Model Checking
Hirokazu Kasahara, Tomoyuki Yokogawa, Yoichiro Sato, Kazutami Arimoto (Okayama Pref. Univ.)
pp. 37 - 42
DC2016-27
Towards a Zone-based Verification for DTPDA with Clock Freezing
Sho Hiraoka, Shoji Yuen (Nagoya Univ.)
pp. 43 - 48
DC2016-28
Efficiency Improvement in #SMT-based Quantitative Information Flow Analysis
Masato Nakashima, Trung Chu Bao, Kenji Hashimoto, Masahiko Sakai, Hiroyuki Seki (Nagoya Univ.)
pp. 49 - 54
DC2016-29
A Direct Update Method for XML Documents Including Data Values Compressed by Tree Grammars
Ryunosuke Takayama, Kenji Hashimoto, Seki Hiroyuki (Nagoya Univ.)
pp. 55 - 60
DC2016-30
Koichi Asano, Shinya Masuda, Mitsuhiro Ogata, Kazumasa Kobayashi (NTT DOCOMO), Atsufumi Tate, Satoru Hirayama (SEC)
pp. 61 - 66
DC2016-31
(See Japanese page.)
pp. 67 - 72
DC2016-32
Soichi Sumi, Yoshiki Higo, Shinji Kusumoto (Osaka Univ.)
pp. 73 - 78
DC2016-33
Software Reuse Detection Focusing on Text in Binary Code
Satoshi Watanabe, Akito Monden (Okayama U.), Haruaki Tamada (Kyoto Sangyo U.), Yuichiro Kanzaki (NIT, Kumamoto College)
pp. 79 - 84
DC2016-34
Software Reuse Detection Using Binary Program Compression
Kosuke Kamimura (NAIST), Akito Monden (Okayama Univ.), Hideaki Hata, Kenichi Matsumoto (NAIST)
pp. 85 - 90
DC2016-35
Software Bug Analysis Based on Archetypal Analysis
Keisuke Takimoto, Akito Monden (Okayama U.), Saya Onoue, Hideaki Hata (NAIST), Yasutaka Kamei (Kyushu U.)
pp. 91 - 96
DC2016-36
A Study of the Growth of Programmers with Online Judge Archives
Yusaku Noriyuki, Takao Nakagawa, Hideaki Hata, Kenichi Matsumoto (NAIST)
pp. 97 - 101
DC2016-37
Naoto Ogura, Shinsuke Matsumoto (Osaka Univ.), Hideaki Hata (NAIST), Shinji Kusumoto (Osaka Univ.)
pp. 103 - 108
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.