Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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ICD2016-16
[Invited Talk]
Accelerating the Sensing World through Imaging Evolution
Yusuke Oike, Hayato Wakabayashi, Tetuo Nomoto (Sony Semiconductor Solutions)
p. 1
ICD2016-17
A fast-start up and fully-integrated 32-MHz clock generator for intermittent VLSI systems
Hiroki Asano, Tetsuya Hirose, Taro Miyoshi, Keishi Tsubaki, Toshihiro Ozaki, Nobutaka Kuroki, Masahiro Numa (Kobe Univ.)
pp. 3 - 8
ICD2016-18
A Low-Power Mixed-Domain Delta-Sigma Time-to-Digital Converter Using Charge-Pump and SAR ADC
Anugerah Firdauzi, Zule Xu, Masaya Miyahara, Akira Matsuzawa (Tokyo Tech.)
pp. 9 - 14
ICD2016-19
[Invited Talk]
Novel Pixel Structure with Stacked Deep Photodiode to Achieve High NIR Sensitivity and High MTF
Hiroki Takahashi, Hiroshi Tanaka, Masahiro Oda, Mitsuyoshi Ando, Naoto Niisoe (TPSCo), Shinichi Kawai, Takuya Asano, Mitsugu Yoshita, Tohru Yamada (PSCS)
pp. 41 - 44
ICD2016-20
[Invited Lecture]
A 0.7V 1.5-to-2.3mW GNSS Receiver with 2.5-to-3.8dB NF in 28nm FD-SOI
Ken Yamamoto, Kenichi Nakano, Gaku Hidai, Yuya Kondo, Hitoshi Tomiyama, Hideyuki Takano, Fumitaka Kondo, Yusuke Shinohe, Hidenori Takeuchi, Nobuhisa Ozawa (SSS), Shingo Harada, Shinichiro Eto, Mari Kishikawa, Daisuke Ide, Hiroyasu Tagami (Sony LSI Design)
pp. 45 - 48
ICD2016-21
[Invited Talk]
A Wireless Power Transfer System with Enhanced Efficiency and Response by Fully-Integrated Fast-Tracking Wireless Constant-Idle-Time Control for Implants
Toru Kawajiri (Keio Univ.), Huang Cheng (Broadcom), Hiroki Ihikuro (Keio Univ.)
pp. 49 - 52
ICD2016-22
[Invited Talk]
Soft Error Immunity of Ultra-Low Voltage SRAM
Masanori Hashimoto (Osaka Univ.)
pp. 53 - 58
ICD2016-23
[Invited Talk]
CMOS Analog IC Technologies Toward AI Era
Toshimasa Matsuoka (Osaka Univ.)
pp. 59 - 61
ICD2016-24
[Invited Talk]
Patch-type EEG System with Stretchable Electrode Sheet for Medical Application
Shusuke Yoshimoto, Teppei Araki, Takafumi Uemura, Toshikazu Nezu, Masaya Kondo (Osaka Univ.), Kenichi Sasai (Panasonic), Masayuki Iwase, Hideki Satake, Akio Yoshida (Mektron), Mitsuru Kikuchi (Kanazawa Univ.), Tsuyoshi Sekitani (Osaka Univ.)
p. 63
ICD2016-25
[Invited Talk]
A Low-power Biopotential Sensor ASIC Chipset capable of EEG Acquisition using Dry Electrodes
Akinori Matsumoto, Koji Morikawa (Panasonic)
pp. 65 - 70
ICD2016-26
[Invited Talk]
Development of an ECoG wireless BMI system toward clinical applications
Hiroshi Ando, Kenichi Takizawa (NICT), Takeshi Yoshida (Hiroshima Univ.), Kojiro Matsushita (Gifu Univ.), Seiji Kameda, Masayuki Hirata, Toshiki Yoshimine (Osaka Univ.), Takafumi Suzuki (NICT)
pp. 71 - 76
ICD2016-27
[Invited Talk]
Features of retinal prosthesis using suprachoroidal transretinal stimulation
-- from an electrical circuit perspective --
Yasuo Terasawa, Kenzo Shodo, Koji Osawa (Nidek), Jun Ohta (NAIST)
pp. 77 - 79
ICD2016-28
[Invited Talk]
SRAM PUF using Polycrystalline Silicon Channel FinFET and Its Evaluation
Shin-ichi O'uchi, Yungxun Liu, Yohei Hori, Toshifumi Irisawa, Hiroshi Fuketa, Yukinori Morita, Shinji Migita, Takahiro Mori, Tadashi Nakagawa, Junichi Tsukada, Hanpei Koike, Meishoku Masahara, Takashi Matsukawa (AIST)
pp. 83 - 87
ICD2016-29
[Invited Talk]
A ReRAM-based Physically Unclonable Function with Bit Error Rate < 0.5% after 10 years at 125°C for 40nm embedded application
Yuhei Yoshimoto, Yoshikazu Katoh, Satoru Ogasahara, Zhiqiang Wei, Kazuyuki Kouno (Panasonic Semiconductor Solutions Co., Ltd.)
pp. 89 - 94
ICD2016-30
[Invited Talk]
Demonstration and performance improvement of ferroelectric HfO2-based tunnel junction
Kamimuta Yuuichi, Shosuke Fujii, Tsunehiro Ino, Riichiro Takaishi, Yasushi Nakasaki, Masumi Saitoh (Toshiba)
pp. 95 - 98
ICD2016-31
[Invited Talk]
A Three-Terminal Spin-Orbit Torque Switching Magnetic Memory Device
-- Toward Realization of High-Speed and Low-Power Nonvolatile Integrated Circuits --
Shunsuke Fukami, Tetsuro Anekawa, Ayato Ohkawara, Chaoliang Zhang, Hideo Ohno (Tohoku Univ.)
pp. 99 - 103
ICD2016-32
[Invited Talk]
A 16nm FinFET Heterogeneous Nona-Core SoC Supporting Functional Safety Standard ISO26262 ASIL B
Chikafumi Takahashi, Shinichi Shibahara, Kazuki Fukuoka, Jun Matsushima, Yuko Kitaji (Renesas System Design), Yasuhisa Shimazaki, Hirotaka Hara, Takahiro Irita (Renesas Electronics)
pp. 105 - 110
ICD2016-33
Impacts of Flexible V_th control and Low Process Variability of SOTB to Ultra-low Voltage Designs
Yasuhiro Ogasahara (AIST)
pp. 111 - 116
ICD2016-34
PN-Body Tied Super Steep SS FET with Body Bias below 1V and Drain Bias 0.1V
Takahiro Yoshida, Jiro Ida, Takashi Horii (KIT), Masao Okihara (Lapis), Yasuo Arai (KEK)
pp. 117 - 121
ICD2016-35
Increased Drain-Induced Variability and Within-Device Variability in Extremely Narrow Silicon Nanowire MOSFETs with Width down to 2nm
Tomoko Mizutani, Kiyoshi Takeuchi, Ryota Suzuki, Takuya Saraya, Masaharu Kobayashi, Toshiro Hiramoto (Univ. of Tokyo)
pp. 123 - 126
ICD2016-36
Performance Enhancement of Tunnel FET by Negative Capacitance
Masaharu Kobayashi, Kyungmin Jang, Nozomu Ueyama, Toshiro Hiramoto (Univ. of Tokyo)
pp. 127 - 130
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.