IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Dependable Computing

Workshop Date : 2016-06-20 / Issue Date : 2016-06-13

DC2016-10
An Estimable Approach for Hypergeometric Distribution Software Reliability Models
Tadashi Dohi, Hiroyuki Okamura (Hiroshima Univ.)
pp. 1 - 6

DC2016-11
On State Assignment of Finite State Machines for Soft Error Resilient Stochastic Computing
Motoi Fukuda, Hideyuki Ichihara, Tsuyoshi Iwagaki, Tomoo Inoue (Hiroshima City Univ.)
pp. 7 - 12

DC2016-12
Relationship between the Number of Fan-Outs and Its Wire-length for a logic gate
Taiki Kobayashi, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.)
pp. 13 - 18

DC2016-13
Random Test Pattern Generation based on Entropy
Toshiaki Ohmameuda (Nat. Inst. Tech., Gunma Coll.)
pp. 19 - 23

DC2016-14
A Binding Method for Testability to Generate Easily Testable Functional Time Expansion Models
Mamoru Sato, Toshinori hosokawa, Tetsuya Masuda, Jun Nishimaki (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.)
pp. 25 - 30

DC2016-15
Partially Parallel Time Domain Reed Solomon Decoder
Kentaro Kato (NIT, Tsuruoka College), Somsak Choomchuay (KMITL)
pp. 31 - 36

DC2016-16
[Invited Talk] Internatoinal Conferecen Report: VTS2016
Kazumi Hatayama (Gunma Univ./Creatron Corp.)
pp. 37 - 42

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan