Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
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CPM2015-76
Structural, Electrical and Optical Properties of ZnO:Ga Films Grown by Reactive Plasma deposition with a DC Arc Discharge
Tomoaki Terasako (Ehime Univ.), Junichi Nomoto, Hisao Makino (Kochi Univ. Technol), Masakazu Yagi (Natl. Institute Technol., Kagawa Coll.), Sho Shirakata (Ehime Univ.), Tetsuya Yamamoto (Kochi Univ. Technol)
pp. 1 - 4
CPM2015-77
Control of Director in Photo-alignment Polymer Liquid Crystal Composites with Homogeneous Alignment by Exposing Linearly Polarized Ultra Violet Light
Takashi Shoho, Tran Minh Tien, Kotaro Kawai, Tomoyuki Sasaki, Moritsugu Sakamoto, Kohei Noda (Nagaoka Univ. of Tech.), Nobuhiro Kawatsuki (Univ. of Hyogo), Kohei Goto (Nissan Chemical Industries), Hiroshi Ono (Nagaoka Univ. of Tech.)
pp. 5 - 8
CPM2015-78
Magnetic anisotropy of Nd0.5Bi2.5Fe5-yGayO12 (y = 0-1) films on glass substrates prepared by metal organic decomposition (MOD) method
Gengjian Lou, Michimasa Sasaki (Nagaoka Univ. of Tech.), Takeshi Kato, Satoshi Iwata (Nagoya Univ.), Takayuki Ishibashi (Nagaoka Univ. of Tech.)
pp. 9 - 12
CPM2015-79
Thin film MnGa fabrication for ultra high density ion irradiation bit patterned media
Takamasa Matsunaga, Kengo Fukuta, Daiki Oshima, Takeshi Kato, Satoshi Iwata (Nagoya Univ.), Shigeru Tsunashima (NISRI)
pp. 13 - 16
CPM2015-80
High-Speed Reference Beam Angle Control Technique for Holographic Memory System
Naohito Ikeda, Taku Hoshizawa, Yusuke Nakamura (Hitachi), Tatsuya Ishitobi, Koichiro Nishimura (HLDS)
pp. 17 - 20
CPM2015-81
High-Speed Reference Beam Angle Control Technique for Holographic Memory System
Takeshi Ogata, Kenichiro Yamada, Koji Fujita, Makoto Hosaka, Kazuyoshi Yamazaki, Kenichi Shimada (Hitachi), Atsushi Okuyama (Tokai Univ)
pp. 21 - 24
CPM2015-82
Properties of the time series signal angle multiplexed holographic memory
Tsutomu Shimura, Yuki Hayashi, Masao Endo, Shinsuke Umegaki (Univ. Tokyo), Ryushi Fujimura (Utsunomiya Univ.)
pp. 25 - 28
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.