IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 111, Number 230

Superconductive Electronics

Workshop Date : 2011-10-12 / Issue Date : 2011-10-05

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Table of contents

SCE2011-12
Origin of dark count in superconducting nanowire single-photon detectors
Taro Yamashita, Shigehito Miki, Kazumasa Makise, Wei Qiu, Hirotaka Terai, Mikio Fujiwara, Masahide Sasaki, Zhen Wang (NICT)
pp. 1 - 6

SCE2011-13
Capacitance measurements of sub-micron Al junctions using SQUID resonance
Kento Kikuchi, Masataka Moriya, Hiroshi Shimada, Yoshinao Mizugaki (UEC Tokyo)
pp. 7 - 12

SCE2011-14
Response of SQUID inductance to magnetic nanoparticle films
Shun Yano, Takayuki Okumura, Hiroyuki Akaike, Akira Fujimaki (Nagoya Univ.)
pp. 13 - 17

SCE2011-15
Improvement in electrical characteristics of NbN tunnel junctions with plasma-nitrided AlNx barriers
Tatsunori Funai, Naoto Naito, Hiroyuki Akaike, Akira Fujimaki (Nagoya Univ.)
pp. 19 - 24

SCE2011-16
Development of AC programmable Josephson voltage standard
Michitaka Maruyama, Chiharu Urano, Takahiro Yamada, Hirotake Yamamori, Nobu-hisa Kaneko (AIST)
pp. 25 - 30

SCE2011-17
Examination of Cryogenic CMOS Amplifiers for Josephson-CMOS Hybrid Memories
Hyunjoo Jin, Keita Kuwabara, Yuki Yamanashi, Nobuyuki Yoshikawa (Yokohama National Univ.)
pp. 31 - 36

SCE2011-18
Development of Nb multi-layer Advanced Fabrication Process for Large-scale SFQ Circuits
Shuichi Nagasawa, Kenji Hinode, Tetsuro Satoh, Mutsuo Hidaka (ISTEC-SRL), Akira Fujimaki, Hiroyuki Akaike (Nagoya Uni.), Nobuyuki Yoshikawa (Yohohama National Uni.), Kazuyoshi Takagi, Naofumi Takagi (Kyoto Uni.)
pp. 37 - 42

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan