IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Electromechanical Devices

Workshop Date : 2008-05-16 / Issue Date : 2008-05-09

EMD2008-5
Degradation phenomenon of electrical contacts by 3-D oscillating mechanism -- Basal characteristics of 3-D oscillating mechanism --
Shin-ichi Wada, Hiroshi Amao, Keiji Koshida, Taketo Sonoda, Hiroto Minegishi, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio)
pp. 1 - 6

EMD2008-6
Spectrum measurement of contacts metal and gas molecular in Break arc -- Spectrum intensity of silver and silver alloy contacts --
Kiyoshi Yoshida, Tatuya Kurosaka (NIT)
pp. 7 - 12

EMD2008-7
Observations of Step-like Contact Voltage Variations in Pd
Shunsuke Sasaki, Hiroyuki Ishida, Shosuke Suzuki, Masanari Taniguchi, Tasuku Takagi (Tohoku Bunka Gakuen Univ.)
pp. 13 - 18

EMD2008-8
An trial assembling a height measurement system utilizing confocal optical system
Makoto Hasegawa (Chitose Inst. of Sci. & Tech.)
pp. 19 - 24

EMD2008-9
Linearity of resistors -- Measurement of electrical distortion caused by resistors --
Isao Minowa, Yuji Ide, Shunsuke Kaneko (Tama. Univ.)
pp. 25 - 30

EMD2008-10
Standardization of optical circuit board for IEC/TC86/JWG9
Junya Kobayashi, Ryo Nagase (NTT)
pp. 31 - 36

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan