電子情報通信学会  
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  古屋 清

A Probablistic Approach to Locally Exhaustive Testing, The Transactions of the IEICE (信学論E), Vol.E72, No5., pp.656-660 (May 1989).

Two-Pattern Test Capablities of Autonomous TPG Circuits, IEICE Trans. on Information & Systems, Vol.E76-D, No.7 pp.800-808 (July 1993).

Design of Autonomous TPG Circuits for use in Two-Pattern Testing, IEICE Trans. on Information & Systems, Vol.E78-D, No.7, pp.882-888 (July 1995).







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