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DB info
Koutaro Hachiya and Atsushi Kurokawa,
"Detecting Resistive-Open Defects of Power TSVs in 3D-ICs,"
IEICE Tech. Rep., CS2019-104, pp. 37-41, Feb. 2020.
Report Number: CS2019-104, CAS2019-104
pLaTeX format
The abbreviation of author's names was made automatically. Please confirm them before you cut and paste.
\bibitem{cs2019-104}
Koutaro~Hachiya and Atsushi~Kurokawa,
``Detecting Resistive-Open Defects of Power TSVs in 3D-ICs,''
{\em IEICE Tech. Rep.}, CS2019-104, pp.~37-41, Feb. 2020.
Detailed information on the IEICE database
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