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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| IA | 2022-11-21 15:30 |
Niigata | Bandai Civic Hall (Niigata) (Primary: On-site, Secondary: Online) |
An investigation of attack cases in robot arm control using ROS Risa Tanaka, Shintaro Ishihara, Toyokazu Akiyama, Kazumasa Kobayashi (Kyoto Sangyo Univ.)  IA2022-42 |
[more] | IA2022-42 pp.33-38 |
| CPSY, DC, IPSJ-ARC [detail] | 2022-10-12 14:00 |
Niigata | Yuzawa Toei Hotel (Primary: On-site, Secondary: Online) |
A Don't Care Filling Algorithm of Control Signals for Concurrent Testing Xu Haofeng, Hosokawa Toshinori (Nihon Univ.), Yoshimura Masayoshi (KSU), Arai Masayuki (Nihon Univ.) CPSY2022-24 DC2022-24 |
In recent years, with the increase in test cost for VLSIs, it has been important to reduce the number of test patterns. ... [more] | CPSY2022-24 DC2022-24 pp.37-42 |
| CPSY, DC, IPSJ-ARC [detail] | 2022-07-27 10:15 |
Yamaguchi | Kaikyo Messe Shimonoseki (Primary: On-site, Secondary: Online) |
On the Acceleration of a Low Power Oriented Test Generation Method Using Fault Excitation Conditions Rei Miura, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) CPSY2022-2 DC2022-2 |
[more] | CPSY2022-2 DC2022-2 pp.7-12 |
| CPSY, DC, IPSJ-ARC [detail] | 2022-07-27 11:00 |
Yamaguchi | Kaikyo Messe Shimonoseki (Primary: On-site, Secondary: Online) |
A Block Partitioning Method to Accelerate Test Generation for Gate-Exhaustive Faults Momona Mizota, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.) CPSY2022-3 DC2022-3 |
In gate-exhaustive fault model which covers defects in cells, since the number of faults is proportion to that of gates,... [more] | CPSY2022-3 DC2022-3 pp.13-18 |
| CPSY, DC, IPSJ-ARC [detail] | 2022-07-27 11:30 |
Yamaguchi | Kaikyo Messe Shimonoseki (Primary: On-site, Secondary: Online) |
An Evaluation of Field Testability Using States Signal Sequences Based on k-Consecutive State Transitions for Field Testing Yudai Toyooka, Yuki Watanabe, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) CPSY2022-4 DC2022-4 |
[more] | CPSY2022-4 DC2022-4 pp.19-24 |
| IA, SITE, IPSJ-IOT [detail] | 2022-03-08 17:35 |
Kyoto | Kyoto University, Yoshida Campus (Primary: On-site, Secondary: Online) |
Design and Implementation of User-Attracted Low-Latency MaaS Platform for Solving Social Issues Hideto Yano, Tomoki Yoshihisa, Shinji Shimojo, Nao Takizaki, Yoshiyuki Kido (Osaka Univ.), Yukiko Kawai, Ryuta Yamaguchi (Kyoto Sangyo Univ.) SITE2021-67 IA2021-80 |
Mobility as a service (Maas), which has been attracting attention in recent years, can be utilized to solve social issue... [more] | SITE2021-67 IA2021-80 pp.124-129 |
| ICSS, IPSJ-SPT | 2022-03-08 10:00 |
Online | Online | Input predictive attack by keyboard acoustic emanations using BERT and its countermeasures Masahiro Iida (Teikyo Univ.), Mitsuaki Akiyama (NTT), Masaki Kamizono (DTCY), Takahiro Kasama (NICT), Yuichi Hattori (Secure Cycle Inc.), Hiroyuki Inoue (Kyoto Sangyo Univ.), Atsuo Inomata (Osaka Univ.) ICSS2021-67 |
The Keyboard Acoustic Emanations has been proposed to estimate the input key from keystroke sounds as a kind of side-cha... [more] | ICSS2021-67 pp.49-54 |
| MBE, NC (Joint) |
2022-03-04 14:20 |
Online | Online | Investigation of machine learning methods for emotion discrimination by using phase synchronization of electroencephalogram Fumiya Hirooka, Jiro Okuda (Kyoto Sangyo Univ. Grad. Sch.) NC2021-74 |
This study investigated machine learning methods for emotion discrimination by using phase synchronization of electroenc... [more] | NC2021-74 pp.143-148 |
| DC | 2022-03-01 13:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
A Logic Locking Method based on SFLL-hd at Register Transfer Level Yohei Noguchi, Masayoshi Yoshimura (Kyoto Sangyo Univ.), Atsuya Tsujikawa, Toshinori Hosokawa (Nihon Univ.) DC2021-72 |
In recent years, with the increase of VLSI integration, LSI design companies utilize circuit design information, called ... [more] | DC2021-72 pp.45-50 |
| HCS | 2022-01-28 15:20 |
Online | Online | Observation of verbal and non-verbal interactions related to Japanese food experience Yasuyuki Sumi (Future Univ. Hakodate), Naomi Yamashita (NTT), Naoe Imura (Kyoto Sangyo Univ.), Akane Okuno (Future Univ. Hakodate) HCS2021-49 |
In order to deepen the understanding of verbal and nonverbal interactions related to the Japanese food experience, we ar... [more] | HCS2021-49 pp.36-42 |
| DC | 2021-12-10 13:00 |
Kagawa | (Primary: On-site, Secondary: Online) |
A Low Power Oriented Multiple Target Test Generation Method Rei Miura, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) DC2021-55 |
In recent years, since capture power consumption for VLSIs significantly increases in at-speed scan testing, low capture... [more] | DC2021-55 pp.1-6 |
| DC | 2021-12-10 14:00 |
Kagawa | (Primary: On-site, Secondary: Online) |
A SAT and FALL Attacks Resistant Logic Locking Method at Register Transfer Level Atsuya Tsujikawa, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2021-57 |
In recent years, to meet strict time-to-market constraints, it has become difficult for only one semiconductor design co... [more] | DC2021-57 pp.13-18 |
| IA | 2021-09-08 14:25 |
Online | Online | Proposal of a Cloud Native IoT Architecture and its applications Shinji Shimojo (Osaka Univ.), Ryuta Yamaguchi (Kyoto Sangyo Univ.), Nao Takizaki, Hideto Yano, Yoshiyuki Kido, Tomoki Yoshihisa (Osaka Univ.), Yukiko Kawai (Kyoto Sangyo Univ.), Yoshiyuki Masuda (Daikin), Matsuki Yamamoto (Osaka Univ.) IA2021-22 |
[more] | IA2021-22 pp.49-53 |
| DE | 2021-07-24 10:50 |
Kanagawa | KAIT IT extension center (Hybrid) (Primary: On-site, Secondary: Online) |
DE2021-5 |
(To be available after the conference date) [more] | DE2021-5 pp.22-27 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2021-03-26 12:00 |
Online | Online | A Logic Locking Method Based on Anti-SAT at Register Transfer Level Atsuya Tsujikawa, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) CPSY2020-64 DC2020-94 |
In recent years, increasing circuit density, it has become difficult for only one semiconductor design company to design... [more] | CPSY2020-64 DC2020-94 pp.85-90 |
| DC | 2021-02-05 15:30 |
Online | Online | A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2020-77 |
A field testing that monitors the values of circuit outputs and internal signal lines during function mode is used as on... [more] | DC2020-77 pp.48-53 |
| NC, NLP (Joint) |
2021-01-22 14:20 |
Online | Online | Contrast dependent spatial frequency tuning dynamics and its underlying neural mechanisms in the cat area 17 Kazuki Kohara, Seisiro Nitta, Hiroki Tanaka (Kyoto Sangyo Univ.) NC2020-40 |
In order to examine neural mechanisms to form spatial frequency (SF) tunings of area 17 neurons, we recorded extracellul... [more] | NC2020-40 pp.45-48 |
| IA | 2020-10-01 15:35 |
Online | Online | [Poster Presentation]
Research and development of Personal Data Store (PDS) with access control for advanced PLR of running data Toyokazu Akiyama (Kyoto Sangyo Univ.), Yukiko Kawai (Kyoto Sangyo Univ./Osaka Univ.), Takumi Kiriu, Shinsuke, Nakajima (Kyoto Sangyo Univ.), Panote Siriaraya (Kyoto Institute of Tech.), Shinji Shimojo (Osaka Univ.) IA2020-9 |
[more] | IA2020-9 p.29 |
| IA | 2020-10-01 16:25 |
Online | Online | [Poster Presentation]
Research and development of a safe bus driving support system considering passenger discomfort Toyokazu Akiyama (Kyoto Sangyo Univ.), Ismail Arai (NAIST), Hiroshi Yamamoto (Ritsumeikan Univ.) IA2020-12 |
[more] | IA2020-12 p.32 |
| CPSY, DC, IPSJ-ARC [detail] | 2020-07-31 15:45 |
Online | Online | A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the number of Test Patterns Ryuki Asami, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) CPSY2020-12 DC2020-12 |
In recent years, as the high density and complexity of integrated circuits have increased, defects in cells have increas... [more] | CPSY2020-12 DC2020-12 pp.75-80 |
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