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=============================================== Technical Committee on Reliability (R) Chair: Shigeru Yanagi Vice Chair: Kazuaki Wakai Secretary: Tetsushi Yuge, Mitsuhiro Kimura Assistant: Naoto Kaio, Hisoyasu Mawatari DATE: Fri, Sep 14, 2007 10:30 - 15:50 PLACE: Kochi University of Technology(Miyanokuchi 185,Tosayamada-cho,Kami-shi,Kochi,782-8502,JAPAN. http://www.kochi-tech.ac.jp/kut_J/access/index.html. Prof. Masaru Sanada. 0887-57-2118) TOPICS: For LSI, evaluation, fault diagnosis, physical analysis and quality ---------------------------------------- Fri, Sep 14 AM (10:30 - 15:50) ---------------------------------------- (1) 10:30 - 10:55 Material Processing by Microplasma in SEM Hidenori Ohi, Yasuaki Okazaki, Tomoyoshi Takahashi, Akimitsu Hatta (Kochi Univ. Technol.) (2) 10:55 - 11:20 Fault logic trace by Using Transistor Operating Point Analysis -- Diagnosis of Feed Back Fault with Oscillating Phenomenon -- Masaru Sanada, Tonoya Nakamura, Keishi Hashida (KUT) (3) 11:20 - 11:45 An idea of fault model by RC network, and the transistor level fault diagnosis trial. Yutaka Yoshizawa (NEC Electoronics) ----- Lunch Break ( 85 min. ) ----- (4) 13:10 - 13:40 [Invited Talk] The Latest Trend of Defect Modeling in LSI Diagnosis -- Tutorial -- Yasuo Sato (Hitachi) (5) 13:40 - 14:05 An expanded Per-Test X-Fault Diagnosis Method for LSI Circuits Yusuke Nakamura, Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara (KIT), K. K. Saluja (Univ. of Wisconsin) (6) 14:05 - 14:30 Evaluation of transmission line for LSI tester and simulation modeling Hidekazu Tsuchiya, Takeshi Asakawa (Tokai univ.), Masayuki Sato (Genesis technology) ----- Break ( 30 min. ) ----- (7) 15:00 - 15:25 The failure analyses and the article of good quality analysis of the electronic component -- The efforts for the reliability improvement of the electronic component which is for automobile use -- Yasuo Imai, Ｄａｉｋｉ Ｔａｎａｋａ (ＯＥＧ) (8) 15:25 - 15:50 Structural analysis as quality evaluation of LSI manufacturing. Masahito Kajinuma, Akira Mizoguchi, Koichirou Takeuchi (MELCO) # Information for speakers General Talk (25) will have 20 minutes for presentation and 5 minutes for discussion. # CONFERENCE SPONSORS: - This conference is co-sponsored by EEE Reliability Society Japan Chapter and Reliability Engineering Association of Japan. === Technical Committee on Reliability (R) === # FUTURE SCHEDULE: Fri, Oct 19, 2007: Kyushu University [Fri, Aug 17], Topics: Reliability, etc. Fri, Nov 16, 2007: [Thu, Sep 20] Fri, Dec 14, 2007: [Fri, Oct 19] # SECRETARY: Tetsushi Yuge (National Defense Academy) TEL +81-46-841-3810 FAX +81-46-844-5903 E-mail:  ge n  Last modified: 2007-08-27 09:13:42 |
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