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Technical Committee on Reliability (R)
Chair: Shigeru Yanagi (National Defense Academy) Vice Chair: Kazuaki Wakai (NHK)
Secretary: Tetsushi Yuge (National Defense Academy), Mitsuhiro Kimura (Hosei Univ.)
Assistant: Naoto Kaio (Hiroshima Shudo Univ.), Hisoyasu Mawatari (NTT)

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Technical Committee on Electromechanical Devices (EMD)
Chair: Hideaki Sone (Tohoku Univ.)
Vice Chair: Makoto Hasegawa (Chitose Inst. of Science and Tech.), Ryo Nagase (NTT)
Secretary: Kiyoshi Yoshida (Nippon Inst. of Tech.), Toru Kawai (JAE)
Assistant: Junya Sekikawa (Shizuoka Univ.)

DATE:
Fri, Feb 15, 2008 10:30 - 17:15

PLACE:
(077-565-5459)

TOPICS:

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Fri, Feb 15 AM (10:30 - 16:20)
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----- Opening Address ( 10 min. ) -----

(1) 10:40 - 11:05
Development of Simple ESD Checker and it's Application
-- Detection of ESD Checker and it's Application --
Norio Yamasaki, Masaru Sanada (KUT)

(2) 11:05 - 11:30
Reliability design and applications for the Non power supply type optical transmission unit
Yoshikazu Toba (Seikoh Giken), Kazuaki Wakai (ITEC)

----- Lunch ( 90 min. ) -----

(3) 13:00 - 13:25
Decomposition process of silicone and electrical contact failure
-- Influence of silicone contamination on contact devices --
Terutaka Tamai (Mie Univ.), Yasuhiro Hattori, Hirosaka Ikeda (ANT)

(4) 13:25 - 13:50
Degradation phenomenon of electrical contacts by 3-D oscillating mechanism
-- 3-D oscillating mechanism for trial --
Shin-ichi Wada, Hiroshi Amao, Hiroto Minegishi, Keiji Koshida, Taketo Sonoda, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio Univ.)

(5) 13:50 - 14:15
Contact Resistance Characteristics of Tin Plated Contacts with Switching Operation and Surface Observation
Shinya Nakamura, Yuji Yamashita, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetwork)

(6) 14:15 - 14:40
Study of Behavior of Contact Resistance of Fretting Corrosion
Naoyuki Sato, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (AutoNetworks)

----- Break ( 15 min. ) -----

(7) 14:55 - 15:20
Accuracy Improvement of Dual Wavelength Push-pull Reflectometry (DWPR) Using a Total Reflector
Yasutoshi Komatsu, Keiichi Inoue, Seiichi Onoda (Watanabe Co.,Ltd.,), Nobuo Tsukamoto (DSP Technology Associaetes, Inc.)

(8) 15:20 - 15:45
The investigation of the material for hermetic sealing
-- About gas permeation of materials --
Tetsuo Hayase, Ichizo Sakamoto (OC.)

(9) 15:45 - 16:10
Reliability of Optical Connector Assembled with Instant Adhesive
Shuichi Yanagi, Shinsuke Matsui, Shigeru Hosono, Ryo Nagase (NTT)

----- Break ( 10 min. ) -----

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Fri, Feb 15 (16:20 - 17:15)
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(10) 16:20 - 17:10
[Special Talk]
Holography and Its Application to Reliability Evaluation of the Electromechnical Devices
Masanari Taniguchi (Tohoku Bunka Gakuen University)

----- Closing Address ( 5 min. ) -----

# CONFERENCE SPONSORS:
- This conference is co-sponsored by EEE Reliability Society Japan Chapter and Reliability Engineering Association of Japan.

=== Technical Committee on Reliability (R) ===
# FUTURE SCHEDULE:

Fri, Apr 18, 2008: Kikai-Shinko-Kaikan Bldg. [Mon, Feb 18]
Fri, May 30, 2008: Kobe Gakuin Univ. [Tue, Mar 18]

# SECRETARY:
Tetsushi Yuge (National Defense Academy)
TEL +81-46-841-3810
FAX +81-46-844-5903
E-mail:

=== Technical Committee on Electromechanical Devices (EMD) ===
# FUTURE SCHEDULE:

Fri, Mar 7, 2008: [Fri, Jan 18]
Fri, Apr 18, 2008: NTT Musashino Research and Development Center [Fri, Feb 22]
Fri, May 16, 2008: Chitose Arcadia Plaza [Fri, Mar 21]

# SECRETARY:
Toru Kawai（JAE）
TEL (042) 549-9262、FAX (042) 549-9583
E-mail: