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Technical Committee on Dependable Computing (DC)
Chair: Michiko Inoue (NAIST) Vice Chair: Satoshi Fukumoto (Tokyo Metropolitan Univ.)
Secretary: Masayoshi Yoshimura (Kyoto Sangyo Univ.), Haruhiko Kaneko (Tokyo Inst. of Tech.)
Assistant: Masayuki Arai (Nihon Univ.)
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Reliability Engineering Association of Japan (REAJ)
President: Nobuyasu Kanekawa (Hitachi)
DATE:
Fri, Dec 15, 2017 12:30 - 16:20
PLACE:
Akita Study Center, The Open University of Japan(1-1 Tagatagakuen-machi, Akita-shi, 010-8502 Japan. 20 min walk from East-exit of JR Akita station. https://www.sc.ouj.ac.jp/center/akita/about/access.html. Koji Iwata. +81-42-573-7324)
TOPICS:
Winter Workshop on safety
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Fri, Dec 15 PM (12:30 - 15:00)
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(1) 12:30 - 12:55
Basic study on vertical curve detection method combined with use of inertial sensors and tachometer generators for correction of train position
Shigeru Taniguchi, Koji Iwata, Yuki Ota (RTRI), Masayuki Kitora, Akira Asano (Kyosan Inc)
(2) 12:55 - 13:20
(See Japanese page.)
(3) 13:20 - 13:45
Verification of a support system for collision prevention at level crossing using image analysis technology and communication technology
Toshihiro Takeuchi, Tomonori Hasegawa, Noboru Ito (NTSEL), Takeshi Mizuma (UTokyo)
(4) 13:45 - 14:10
Evaluation of Flexible Wireless Sensor System
Yosuke Nakamura, Hiroshi Mochizuki, Hideo Nakamura (Nihon Univ.)
(5) 14:10 - 14:35
A Collaborative-Task Assignment Algorithm for Disaster Recovery
Ryouta Mizuhara, Kazuya Sakai, Satoshi Fukumoto (Tokyo Metropolitan Univ.)
(6) 14:35 - 15:00
Evaluation of the weakness of the consensus algorithm in the block chain
Kazuki Matsuoka, Masato Kitakami (Chiba Univ.)
----- Break ( 5 min. ) -----
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Fri, Dec 15 PM (15:05 - 16:20)
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(7) 15:05 - 15:30
Weighted Fault Coverage Considering Via Open Faults
Taiki Kobayashi, Kazuhiko Iwasaki (TMU)
(8) 15:30 - 15:55
A Test Clock Observation Method Using Time-to-Digital Converters for Built-In Self-Test in FPGAs
Yousuke Miyake, Yasuo Sato, Seiji Kajihara (KIT)
(9) 15:55 - 16:20
[Invited Talk]
Hardware Trojan detection based on side-channel analysis
Michiko Inoue (NAIST)
# Information for speakers
General Talk will have 20 minutes for presentation and 5 minutes for discussion.
# CONFERENCE SPONSORS:
- Reliability Engineering Association of Japan
=== Technical Committee on Dependable Computing (DC) ===
# FUTURE SCHEDULE:
Tue, Feb 20, 2018: Kikai-Shinko-Kaikan Bldg. [Fri, Dec 15], Topics: VLSI Design and Test, etc.
Wed, Mar 7, 2018 - Thu, Mar 8, 2018: Okinoshima Bunka-Kaikan Bldg. [Fri, Jan 12], Topics: ETNET2018
=== Reliability Engineering Association of Japan (REAJ) ===
Last modified: 2017-10-12 10:03:52
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