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Technical Committee on Electron Device (ED) [schedule] [select]
Chair Tetsu Kachi (Toyota Central R&D Labs.)
Vice Chair Naoki Hara (Fujitsu Labs.)
Secretary Michihiko Suhara (Tokyo Metropolitan Univ.), Tetsuzo Ueda (Panasonic)
Assistant Seiya Kasai (Hokkaido Univ.), Koji Matsunaga (NEC)

Conference Date Thu, Jul 26, 2012 13:30 - 16:40
Fri, Jul 27, 2012 09:30 - 12:15
Topics Semiconductor Process and Devices (surface, interface, reliability), others 
Conference Place  

Thu, Jul 26 PM 
13:30 - 16:40
(1) 13:30-13:55 Effects of annealing on DC performance of AlGaN/GaN MIS HEMTs Maiko Hatano, Yuya Taniguchi, Hirokuni Tokuda, Masaaki Kuzuhara (Univ. Fukui)
(2) 13:55-14:20 Measurement of Channel Electron Mobility in AlGaN/GaN MISHFET Kentaro Tamai, Jin-Ping Ao (Tokushima Univ.), Daigo Kikuta (Toyota Central R&D Labs., Inc.), Masahiro Sugimoto (Toyota Motor Corporation), Yasuo Ohno (Tokushima Univ.)
(3) 14:20-14:45 Temperature dependence of frequency dispersion in $C$-$V$ characteristics of AlN/AlGaN/GaN MIS-HFET Hong-An Shih, Masahiro Kudo, Toshi-kazu Suzuki (JAIST)
  14:45-15:00 Break ( 15 min. )
(4) 15:00-15:25 Interface characterization of AlInN/GaN heterostructures Tamotsu Hashizume, Yujin Hori, Masamichi Akazawa (Hokkaido Univ.)
(5) 15:25-15:50 Effect of ICP Etching on p-type GaN Schottky Contacts Toshifumi Takahashi (Univ. of Fukui), Naoki Kaneda, Tomoyoshi Mishima (Hitachi Cable), Kazuki Nomoto (Univ. of Notre Dame), Kenji Shiojima (Univ. of Fukui)
(6) 15:50-16:15 Electrical Characteristics of Surface Stoichiometry Controlled p-GaN Schottky Contacts Toshifumi Takahashi (Univ. of Fukui), Naoki Kaneda, Tomoyoshi Mishima (Hitachi Cable), Takashi Kajiwara, Satoru Tanaka (Kyushu Univ.), Kenji Shiojima (Univ. of Fukui)
(7) 16:15-16:40 Investigation of impact ionization in AlGaN/GaN HEMTs using full-band Monte Carlo model Kazuki Kodama, Hirokuni Tokuda, Masaaki Kuzuhara (Fukui Univ.)
Fri, Jul 27 AM 
09:30 - 12:15
(8) 09:30-09:55 Delay Time Analysis of Strained InSb HEMTs Using Quantum-Corrected Monte Carlo Method Yutaro Nagai, Jun Sato, Shinsuke Hara, Hiroki I. Fujishiro (Tokyo Univ. of Sci.), Akira Endoh, Issei Watanabe (NICT)
(9) 09:55-10:20 Modeling of nonlinear quantum transport for tunnel diodes and theoretical analysis of its cut-off frequency Shin Yamashita, Yuji Kurakami, Mitsufumi Saito, Michihiko Suhara (Tokyo Metro. Univ.)
(10) 10:20-10:45 Large-signal analysis of injection locking and frequency comb properties in array oscillators consisting of resonant tunneling diodes integrated with wideband antennas Kiyoto Asakawa, Atsushi Tashiro, Mitsufumi Saito, Michihiko Suhara (Tokyo Metro. Univ.)
  10:45-11:00 Break ( 15 min. )
(11) 11:00-11:25 Study on Synchronized Charge Transfer and Efficiency in GaAs-based Etched Nanowire CCD Yuki Nakano, Takayuki Tanaka, Seiya Kasai (Hokkaido Univ.)
(12) 11:25-11:50 Spin injection experiment into high In-content InGaAs/InAlAs two-dimensional electron gas carried out in a non-local configuration Shiro Hidaka, Taro Kondo, Masashi Akabori, Syoji Yamada (JAIST)
(13) 11:50-12:15 Graphene FET with Diamondlike Carbon Dielectrics Susumu Takabayashi, Meng Yang, Shuichi Ogawa, Hiroyuki Hayashi, Yuki Kurita, Yuji Takakuwa, Tetsuya Suemitsu, Taiichi Otsuji (Tohoku Univ.)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
ED Technical Committee on Electron Device (ED)   [Latest Schedule]
Contact Address Michihiko Suhara (Tokyo Metropolitan Univ.)
TEL : +81-42-677-2765 Fax : +81-42-677-2756
E--mail : t
Tetsuzo Ueda(Panasonic)
TEL:+81-75-956-8273、FAX:+81-75-956-9110
E--mailzopac 


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