Fri, May 13 PM 13:30 - 17:40 |
(1) |
13:30-14:10 |
[Invited Talk]
The combinational or selective usage of the laser SQUID microscope, the laser terahertz emission microscope, and related simulations
-- Non-electrical-contact fault localization in LSI chips -- |
Kiyoshi Nikawa (Osaka Univ.), Masatsugu Yamashita (RIKEN), Toru Matsumoto (HPK), Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae (Osaka Univ.) |
(2) |
14:10-14:35 |
Observation of Vth Distribution of MONOS Flash Memory Using Scanning Nonlinear Dielectric Microscopy |
Koichiro Honda (Fujitsu Labs.), Yasuo Cho (Tohoku Univ.) |
(3) |
14:35-15:00 |
Crystal structure analysis of Carbon Nanotube Forests by XRD |
Hiroshi Furuta (KUT) |
(4) |
15:00-15:25 |
Bias-Temperature Instability in Zin Oxide Thin-Film Transistors |
Mamoru Furuta, Takahiro Hiramatsu, Tokiyoshi Matsuda, Takashi Hirao (Kochi Univ. of Tech.), Yudai Kamada, Shizuo Fujita (Kyoto Univ.) |
|
15:25-15:45 |
Break ( 20 min. ) |
(5) |
15:45-16:25 |
[Invited Talk]
Failure analysis method using a Laser excitation quasi-electrostatic field sensing technique |
Seigo Ito, Kiyoaki Takiguchi (Tokyo Univ.) |
(6) |
16:25-16:50 |
Evaluation of defect-tolerance in the quantum-dot cellular automata PLA |
Katsuyoshi Miura, Takayuki Notsu, Koji Nakamae (Osaka Univ) |
(7) |
16:50-17:15 |
Produce of Yield Analysis System at Semiconductor Manufacture Factory. |
Shingo Himeno (Toshiba Oita Operations) |
(8) |
17:15-17:40 |
Candidate Fault Portions Detection using CMOS Transistor Operation Point Analysis |
Kazuaki Kishi, Masaru Sanada (KUT) |