IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 116, Number 330

VLSI Design Technologies

Workshop Date : 2016-11-28 - 2016-11-30 / Issue Date : 2016-11-21

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Table of contents

VLD2016-44
A Design Method of Circuits to Generate Stochastic Numbers with the Minimum Inputs
Ritsuko Muguruma, Shigeru Yamashita (Ritsmeikan Univ.)
pp. 1 - 6

VLD2016-45
Scheduling of Malleable Fork-Join Tasks
Kana Shimada, Ittetsu Taniguchi, Hiroyuki Tomiyama (Ritsumeikan Univ.)
pp. 7 - 11

VLD2016-46
2-step Charge Pump Voltage Booster Circuit for Micro Energy Harvesting
Tomoya Kimura, Hiroyuki ochi (Ritsumeikan Univ.)
pp. 13 - 18

VLD2016-47
Feasibility studies and evaluation for Level-Shifter less design in Silicon-on-Thin-BOX (SOTB)
Shunsuke Kogure, Kimiyoshi Usami (Shibaura Institute of Tech)
pp. 19 - 24

VLD2016-48
Implementation Flow of General-Synchronous Circuits from RTL Representation for Xilinx FPGA
Manri Terada, Hayato Mashiko, Yukihide Kohira (Univ. of Aizu)
pp. 25 - 30

VLD2016-49
Evaluation of Radiation-Hard Circuit Structures in a FDSOI Process by TCAD Simulations
Kodai Yamada, Haruki Maruoka, Shigehiro Umehara, Jun Furuta, Kazutoshi Kobayashi (KIT)
pp. 31 - 36

VLD2016-50
Evaluation of Soft Error Hardness of FinFET and FDSOI Processes by the PHITS-TCAD Simulation System
Shigehiro Umehara, Jun Furuta, Kazutoshi Kobayashi (KIT)
pp. 37 - 41

VLD2016-51
Evaluation of Soft Error Rates of FlipFlops on FDSOI by Heavy Ions
Masashi Hifumi, Shigehiro Umehara, Haruki Maruoka, Jun Furuta, Kazutoshi Kobayashi (KIT)
pp. 43 - 48

VLD2016-52
Circuit Simulation Method Using Bimodal Defect-Centric Model of Random Telegraph Noise on 40 nm SiON Process
Michitarou Yabuuchi, Azusa Oshima, Takuya Komawaki, Kazutoshi Kobayashi, Ryo Kishida, Jun Furuta (KIT), Pieter Weckx (KUL/IMEC), Ben Kaczer (IMEC), Takashi Matsumoto (Univ. of Tokyo), Hidetoshi Onodera (Kyoto Univ.)
pp. 49 - 54

VLD2016-53
Design and Implementation Methodology of Low-power Standard cell memory with optimized body-bias separation in Silicon-on-Thin-BOX (SOTB)
Yusuke Yoshida, Kimiyoshi Usami (Shibaura Institute of Tech.)
pp. 55 - 60

VLD2016-54
Ultra Low Power Reconfigurable Accelerator CC-SOTB2
Koichiro Masuyama, Naoki Ando, Yusuke Matsushita, Hayate Okuhara, Hideharu Amano (Keio Univ.)
pp. 61 - 66

VLD2016-55
FPGA Design and Evaluation of Selector-Logic-based Butterfly Unit
Koki Ito, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.)
pp. 67 - 72

VLD2016-56
Accurate Lithography Simulation Model based on Deep Learning
Yuki Watanabe, Tetsuaki Matsunawa, Taiki Kimura, Shigeki Nojima (Toshiba)
pp. 73 - 78

VLD2016-57
Length Difference Minimization with Exchanging Pin Pair for Set Pair Routing Problem
Shutaro Hara, Kunihiro Fujiyoshi (TUAT)
pp. 79 - 84

VLD2016-58
SADP-Cut Aware Two-color Grid Routing
Hatsuhiko Miura, Mitsuru Hasegawa, Kunihiro Fujiyoshi (TUAT)
pp. 85 - 90

VLD2016-59
[Keynote Address] CMOS Annealing Machine to Solve Combinatorial Optimization Problems for IoT Era
Masanao Yamaoka (Hitachi)
pp. 91 - 96

VLD2016-60
[Keynote Address] The development of video coding technology and contribution to HD transition
Akira Nakagawa (Fujitsu Labs.)
p. 97

VLD2016-61
Fast Test Pattern Reordering Based on Weighted Fault Coverage
Shingo Inuyama, Kazuhiko Iwasaki (Tokyo Metropolitan Univ.), Masayuki Arai (Nihon Univ.)
pp. 99 - 104

VLD2016-62
Design of TDC Embedded in Scan FFs for Testing Small Delay Faults
Shingo Kawatsuka, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.)
pp. 105 - 110

VLD2016-63
On SAT based test pattern generation for transition faults considering signal activities
Yusuke Matsunaga (Kyushu Univ.)
pp. 111 - 115

VLD2016-64
A Method of LRSR Seed Generation for On-chip Fault Diagnosis
Hayato Minamizono, Satoshi Ohtake (Oita Univ.)
pp. 117 - 122

VLD2016-65
Partitioned Hash-table and Balanced-tree based FIB Architecture
Kenta Shimazaki (Waseda Univ.), Yuta Ukon, Akihiko Miyazaki (NTT), Toshitaka Tsuda, Hidenori Nakazato, Nozomu Togawa (Waseda Univ.)
pp. 123 - 128

VLD2016-66
Malisious tamper detector design with capacitance measurement for IoT devices in operation
Ryosuke Kitayama (Waseda Univ.), Takashi Takenaka (NEC), Masao Yanagisawa, Nozomu Togawa (Waseda Univ.)
pp. 129 - 134

VLD2016-67
A Golden-IC Free Clock Tree Driven Authentication Approach for Hardware Trojan Detection
Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue (NAIST), Alex Orailoglu (UCSD)
pp. 135 - 140

VLD2016-68
An aging aware high-level synthesis algorithm with floorplanning
Koki Igawa, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.)
pp. 141 - 146

VLD2016-69
Data Transfer Optimization for Cycle Count and Buffer Size Reduction in Accelerator Design with High-Level Synthesis
Daisuke Ishikawa, Kenshu Seto (TCU)
pp. 147 - 152

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan