Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2013] | [2014] | [2015] | [2016] | [2017] | [2018] | [2019] | [Japanese] / [English]
R2016-49
Estimation of three parameters of Weibull distribution by a discretization mdel
Kenji Uogishi
pp. 1 - 6
R2016-50
Software Reliability Analysis Based on Machine Learning
Toru Kaise (Univ. of Hyogo)
pp. 7 - 11
R2016-51
Optimization of The Production condition range based on maximum likelihood estimation
Toshinari Matsuoka (MELCO)
pp. 13 - 18
R2016-52
A Study on Electro Chemical Migration Test for Printed Circuit Board
Sadanori Ito (Itoken)
pp. 19 - 22
R2016-53
The effect of high gray-scale resolution for the high observation performance in X-ray inspection systems
Teruo Shibano (MELCO)
pp. 23 - 28
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.