IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 116, Number 260

Reliability

Workshop Date : 2016-10-21 / Issue Date : 2016-10-14

[PREV] [NEXT]

[TOP] | [2013] | [2014] | [2015] | [2016] | [2017] | [2018] | [2019] | [Japanese] / [English]

[PROGRAM] [BULK PDF DOWNLOAD]


Table of contents

R2016-42
Analysis of the Ceiling by the Gompertz Curve Model with Data Described by the Logistic Curve Model
Daisuke Satoh, Ryutaro Matsumura (NTT)
pp. 1 - 6

R2016-43
History and positioning of service reliability terms up to the JIS Z 8115 draft amendment
Akihiko Masuda (R7 Practical Studio)
pp. 7 - 12

R2016-44
Maintenance Policies for a System with Random and Pre-determined Working Time
Tomohiro Kitagawa, Tetsushi Yuge, Shigeru Yanagi (NDA)
pp. 13 - 18

R2016-45
Reliability Analysis of Redundant Systems Considering Common-Cause Failure
Megumi Maruyama, Tetsushi Yuge, Shigeru Yanagi (NDA)
pp. 19 - 24

R2016-46
Proposal using Combining System for Relationship on Reliability of Linear Connected (1,2)-or-(2,1)-out-of-(2,n): F System
Takumi Ishikawa (Tokyo Metropolitan Univ.), Takashi Shinzato (Hitotsubashi Univ.), Taishin Nakamura, Xiao Xiao (Tokyo Metropolitan Univ.), Tomoaki Akiba (Chiba Tech), Hisashi Yamamoto (Tokyo Metropolitan Univ.)
pp. 25 - 29

R2016-47
A Summary of Replacement Policies for Continous Damage Models
Syouji Nakamura (Kinjo Gakuin Univ), Kodo Itoh (Fukushima Univ), Toshio Nakagawa (AIT)
pp. 31 - 35

R2016-48
A Note on Transient Analysis of Software Rejuvenation Model with Phase-Type Approximation
Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
pp. 37 - 42

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan