IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Reliability

Workshop Date : 2016-02-19 / Issue Date : 2016-02-12

R2015-65
Investigation of Electrical Contacts on a Nanometer Scale using a Nano-manipulator in Scanning Electron Microscope
Jun Toyoizumi, Masanori Onuma, Takaya Kondo, Kikuo Mori (yazaki), Tetsuo Shimizu, Sumiko Kawabata, Norimichi Watanabe (AIST)
pp. 1 - 6

R2015-66
Characterization of Contact Oil in Electrical Contacts by the Alternating Current Impedance Method
Fumitaka Teraoka, Kazuo Iida (Mie Univ.), Shigeru Sawada, Atsushi Shimizu (AutoNetworks Tech.)
pp. 7 - 12

R2015-67
Dependence of time evolution of contact resistance at the closed electrical contacts (6)
Keita Miyashige, Sekikawa Junya (Shizuoka Univ.)
pp. 13 - 17

R2015-68
Restriction on Moving of Break Arcs Magnetically Blown-out with a High Polymer Material
Keisuke Kato, Junya Sekikawa (Shizuoka Univ.)
pp. 19 - 24

R2015-69
Study on microscopic deformation of connecting points for fiber-optic connectors (2)
Sirou Aono, Katsuyoshi Sakaime, Daisuke Saegusa, Ryo Nagase (CIT)
pp. 25 - 30

R2015-70
Latest Trends of JIS Z8115 DependabilityTerminology amendment drafts -- Focus on relevant terms of failure and fault --
Fumiaki Harada (FXAT), AKihiko Masuda (R7 Studio), Tateki NIsh (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental motor)
pp. 31 - 36

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan